APPARATUS AND METHOD FOR MEASURING CAPACITANCE TO GROUND OF CONDUCTOR

• US 20080297175A1
• Filed: 05/18/2008
• Published: 12/04/2008
• Est. Priority Date: 05/31/2007
• Status: Abandoned Application

• Current Assignee: Yingchao Wu
• Original Assignee: Yingchao Wu
• Inventors: WU, Yingchao
• Application Number:
  US12/122,716
• Publication Number:
  US 20080297175A1
• Time in Patent Office: Days
• US Class Current: 324/686
• CPC Class Codes: G01D 5/24 by varying capacitance

Abstract

Apparatus and method for measuring the capacitance to ground of a conductor are disclosed. The apparatus includes at least three switching elements, a voltage measurement circuit, and a controller. Two terminals of a first switching element are connected respectively to a distal terminal of a sample capacitor and a first voltage. Two terminals of a second switching element are connected respectively to a proximal terminal of the sample capacitor and a second voltage. Two terminals of a third switching element are connected respectively to the proximal terminal and the first voltage. The proximal terminal is directly electrically connected to one conductor end. The conductor has an unknown capacitance to ground representative of an object to be sensed. The change in the capacitance of the unknown capacitance capacitor can be determined and a proximity or contact of the object can thus be sensed by using the above apparatus and method.

Claims

1. An apparatus for measuring the capacitance to ground of a conductor, the apparatus comprising:

at least three switching elements including first, second and third switching elements, each of the first, second and third switching elements having both a respective open state and a single respective closed state, one terminal of each of the first, second and third switching elements electrically connected to one of first and second distinct voltages;

a sample capacitor having two terminals and having a given capacitance, one of the two terminals of the sample capacitor electrically connected to another terminal of each of the first, second and third switching elements, a proximal one of the two terminals of the sample capacitor directly electrically connected to one end of a conductor by means not comprising one of the switching elements, the other terminal of the two terminals distal from the conductor, the conductor having an unknown capacitance to ground;

a voltage measurement circuit directly electrically connected to one of the two terminals of the sample capacitor by means not comprising one of the switching elements; and

a controller for operating the first, second and third switching elements so that at any time at least one of the first, second and third switching elements is in its respective open state;

wherein;

the two terminals of the first switching element are connected respectively to the distal terminal of the sample capacitor and the first voltage, the first switching element connects the distal terminal of the sample capacitor to the first voltage when in its closed state and disconnects the distal terminal from the first voltage when in its open state;

the two terminals of the second switching element are connected respectively to the proximal terminal of the sample capacitor and the second voltage, the second switching element connects the proximal terminal of the sample capacitor to the second voltage when in its closed state and disconnects the proximal terminal from the second voltage when in its open state; and

the two terminals of the third switching element are connected respectively to the proximal terminal of the sample capacitor and the first voltage, the third switching element connects the proximal terminal of the sample capacitor to the first voltage when in its closed state and disconnects the proximal terminal from the first voltage when in its open state.

2. The apparatus in accordance with claim 1, wherein the first voltage is a given DC supply voltage, and the second voltage is a given DC supply voltage higher than the first voltage.

3. The apparatus in accordance with claim 1, wherein the second voltage is a given DC supply voltage, and the first voltage is a given DC supply voltage higher than the second voltage.

4. The apparatus in accordance with claim 1, wherein each of the first, second and third switching elements comprises a respective field effect transistor, and the controller comprises a clocked voltage pulse source.

5. The apparatus in accordance with claim 2, wherein each of the first, second and third switching elements comprises a respective field effect transistor, and the controller comprises a clocked voltage pulse source.

6. The apparatus in accordance with claim 3, wherein each of the first, second and third switching elements comprises a respective field effect transistor, and the controller comprises a clocked voltage pulse source.

7. A method for measuring the capacitance to ground of a conductor using a measuring apparatus, the measuring apparatus comprising:

at least three switching elements including first, second and third switching elements, each of the first, second and third switching elements having both a respective open state and a single respective closed state, one terminal of each of the first, second and third switching elements electrically connected to one of first and second distinct voltages;

a sample capacitor having two terminals and having a given capacitance, one of the two terminals of the sample capacitor electrically connected to another terminal of each of the first, second and third switching elements, a proximal one of the two terminals of the sample capacitor directly electrically connected to one end of a conductor by means not comprising one of the switching elements, the other terminal of the two terminals distal from the conductor, the conductor having an unknown capacitance to ground;

a voltage measurement circuit directly electrically connected to one of the two terminals of the sample capacitor by means not comprising one of the switching elements; and

a controller for operating the first, second and third switching elements so that at any time at least one of the first, second and third switching elements is in its respective open state, wherein the two terminals of the first switching element are connected respectively to the distal terminal of the sample capacitor and the first voltage, the first switching element connects the distal terminal of the sample capacitor to the first voltage when in its closed state and disconnects the distal terminal from the first voltage when in its open state;

the two terminals of the second switching element are connected respectively to the proximal terminal of the sample capacitor and the second voltage, the second switching element connects the proximal terminal of the sample capacitor to the second voltage when in its closed state and disconnects the proximal terminal from the second voltage when in its open state;

the two terminals of the third switching element are connected respectively to the proximal terminal of the sample capacitor and the first voltage, the third switching element connects the proximal terminal of the sample capacitor to the first voltage when in its closed state and disconnects the proximal terminal from the first voltage when in its open state; and

wherein, the first voltage is a given DC supply voltage, and the second voltage is a given DC supply voltage higher than the first voltage;

wherein the method for measuring the capacitance to ground of a conductor comprises the steps of;

a) resetting the sample capacitor by closing both the first switching element and the third switching element and opening the second switching element to thereby connect both the distal and proximal terminals of the sample capacitor to the first voltage;

b) opening both the first switching element and the third switching element;

c) closing the second switching element, waiting an interval having a selected duration and thereafter opening the second switching element;

d) charging the sample capacitor by closing the first switching element for an interval having a selected duration;

e) measuring a voltage difference across the sample capacitor using the voltage measurement circuit, the voltage difference representative of the capacitance to ground of the conductor.

8. The method in accordance with claim 7, further comprising a step f), subsequent to step e), of repeating steps b), c), d), e) a selected number of times.

9. The method in accordance with claim 7, further comprising a step d1), intermediate steps d) and e), of repeating steps b), c), d) a selected number of times, wherein the step d1) proceeds to step e) after the selected number of times of the repeating is completed.

10. The method in accordance with claim 7, further comprising a step c0), prior to step c), of changing the amount of the charges on the sample capacitor by a selected amount.

11. A method for measuring the capacitance to ground of a conductor using a measuring apparatus, the measuring apparatus comprising:

at least three switching elements including first, second and third switching elements, each of the first, second and third switching elements having both a respective open state and a single respective closed state, one terminal of each of the first, second and third switching elements electrically connected to one of first and second distinct voltages;

a sample capacitor having two terminals and having a given capacitance, one of the two terminals of the sample capacitor electrically connected to another terminal of each of the first, second and third switching elements, a proximal one of the two terminals of the sample capacitor directly electrically connected to one end of a conductor by means not comprising one of the switching elements, the other terminal of the two terminals distal from the conductor, the conductor having an unknown capacitance to ground;

a voltage measurement circuit directly electrically connected to one of the two terminals of the sample capacitor by means not comprising one of the switching elements; and

a controller for operating the first, second and third switching elements so that at any time at least one of the first, second and third switching elements is in its respective open state, wherein the two terminals of the first switching element are connected respectively to the distal terminal of the sample capacitor and the first voltage, the first switching element connects the distal terminal of the sample capacitor to the first voltage when in its closed state and disconnects the distal terminal from the first voltage when in its open state;

the two terminals of the second switching element are connected respectively to the proximal terminal of the sample capacitor and the second voltage, the second switching element connects the proximal terminal of the sample capacitor to the second voltage when in its closed state and disconnects the proximal terminal from the second voltage when in its open state;

the two terminals of the third switching element are connected respectively to the proximal terminal of the sample capacitor and the first voltage, the third switching element connects the proximal terminal of the sample capacitor to the first voltage when in its closed state and disconnects the proximal terminal from the first voltage when in its open state; and

wherein, the second voltage is a given DC supply voltage, and the first voltage is a given DC supply voltage higher than the second voltage;

wherein the method for measuring the capacitance to ground of a conductor comprises the steps of;

a) resetting the sample capacitor by closing both the first switching element and the third switching element and thereby connecting both the distal and proximal terminals of the sample capacitor to the first voltage;

b) opening all of the first, second, and third switching elements;

c) charging the sample capacitor by closing the first switching element, waiting an interval having a selected duration and thereafter opening the first switching element;

d) closing the second switching element, and waiting a selected interval;

e) measuring a voltage difference across the sample capacitor using the voltage measurement circuit, the voltage difference representative of the capacitance to ground of the conductor.

12. The method in accordance with claim 11, further comprising a step f), subsequent to step e), of repeating steps b), c), d), e) a selected number of times.

13. The method in accordance with claim 11, further comprising a step d1), intermediate steps d) and e), of repeating steps b), c), d) a selected number of times, wherein the step d1) proceeds to step e) after the selected number of times of the repeating is completed.

14. The method in accordance with claim 11, further comprising a step c0), prior to step c), of changing the amount of the charges on the sample capacitor by a selected amount.

15. A method for measuring the capacitance to ground of a conductor using a measuring apparatus, the measuring apparatus comprising:

at least three switching elements including first, second and third switching elements, each of the first, second and third switching elements having both a respective open state and a single respective closed state, one terminal of each of the first, second and third switching elements electrically connected to one of first and second distinct voltages;

a sample capacitor having two terminals and having a given capacitance, one of the two terminals of the sample capacitor electrically connected to another terminal of each of the first, second and third switching elements, a proximal one of the two terminals of the sample capacitor directly electrically connected to one end of a conductor by means not comprising one of the switching elements, the other terminal of the two terminals distal from the conductor, the conductor having an unknown capacitance to ground;

a voltage measurement circuit directly electrically connected to one of the two terminals of the sample capacitor by means not comprising one of the switching elements; and

a controller for operating the first, second and third switching elements so that at any time at least one of the first, second and third switching elements is in its respective open state, wherein the two terminals of the first switching element are connected respectively to the distal terminal of the sample capacitor and the first voltage, the first switching element connects the distal terminal of the sample capacitor to the first voltage when in its closed state and disconnects the distal terminal from the first voltage when in its open state;

the two terminals of the second switching element are connected respectively to the proximal terminal of the sample capacitor and the second voltage, the second switching element connects the proximal terminal of the sample capacitor to the second voltage when in its closed state and disconnects the proximal terminal from the second voltage when in its open state;

the two terminals of the third switching element are connected respectively to the proximal terminal of the sample capacitor and the first voltage, the third switching element connects the proximal terminal of the sample capacitor to the first voltage when in its closed state and disconnects the proximal terminal from the first voltage when in its open state; and

wherein, the first voltage is a given DC supply voltage, and the second voltage is a given DC supply voltage higher than the first voltage;

wherein the method for measuring the capacitance to ground of a conductor comprises the steps of;

a) closing both the first switching element and the second switching element for an interval having a selected duration so that the sample capacitor stores a selected amount of charges;

b) opening both the first and second switching elements;

c) closing the third switching element for an interval having a selected duration and thereafter opening the third switching element;

d) discharging the sample capacitor by closing the first switching element for an interval having a selected duration;

e) measuring a voltage difference across the sample capacitor using the voltage measurement circuit, the voltage difference representative of the capacitance to ground of the conductor.

16. The method in accordance with claim 15, further comprising a step f), subsequent to step e), of repeating steps b), c), d), e) a selected number of times.

17. The method in accordance with claim 15, further comprising a step d1), intermediate steps d) and e), of repeating steps b), c), d) a selected number of times, wherein the step d1) proceeds to step e) after the selected number of times of the repeating is completed.

18. The method in accordance with claim 15, further comprising a step c0), prior to step c), of changing the amount of the charges on the sample capacitor by a selected amount.