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INTEGRATED CIRCUIT DIE WITH LOGICALLY EQUIVALENT BONDING PADS

  • US 20080299704A1
  • Filed: 06/12/2008
  • Published: 12/04/2008
  • Est. Priority Date: 11/10/2004
  • Status: Active Grant
First Claim
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1. A method of producing system-in-package devices, comprising the steps of:

  • (a) providing two substantially identical first integrated circuit dies, each said first integrated circuit die having a plurality of bonding pads, wherein two of said bonding pads share a common logical function;

    (b) providing a second integrated circuit die that is functionally different from said first integrated circuit dies, said second integrated circuit die having a plurality of bonding pads;

    (c) providing a third integrated circuit die that is functionally identical to said second integrated circuit die, said third integrated circuit die having a plurality of bonding pads, said bonding pads of said third integrated circuit die having a different geometric arrangement than said bonding pads of said second integrated circuit die;

    (d) producing a first system-in-package device by steps including directly electrically connecting a first of said two bonding pads, of one of said first integrated circuit dies, that share said common logical function, to one of said bonding pads of said second integrated circuit die; and

    (e) producing a second system-in-package device by steps including directly electrically connecting a second of said two bonding pads, of another of said first integrated circuit dies, that share said common logical function, to one of said bonding pads of said third integrated circuit die, wherein said one bonding pad of said third integrated circuit die is functionally identical to but geometrically different than said one bonding pad of said second integrated circuit die.

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