Method and device for preparing an implant from an implant material
First Claim
1. Method for preparing an implant from an implant material, said implant serving to fill a defect in a human or animal body, wherein a defect image of the defect having a defect contour is made available, a first calibration member arranged in or adjacent to the defect being displayed in said image, wherein a second calibration member is arranged on or adjacent to the implant material to be processed, said second calibration member corresponding to the first calibration member, wherein a real-time image of the implant material is taken and displayed in real time on a display device, wherein the defect image made available is displayed on the display device and superimposed on the real-time image in such a manner that the first and the second calibration members are displayed one on top of the other in the same shape and size and wherein a processing tool is displayed in the real-time image on the display device and moved over the implant material in such a manner that it follows the defect contour displayed in the defect image on the display device.
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Accused Products
Abstract
A method and device for preparing an implant from an implant material are provided. A defect image of the defect which has a defect contour is made available, in which a first calibration member arranged in or adjacent to the defect is displayed. A second calibration member is arranged on or adjacent to the implant material to be processed, this second calibration member corresponding to the first calibration member. A real-time image of the implant material is displayed on a display device. The defect image is displayed on the display device and superimposed on the real-time image so that the first and the second calibration members are displayed one on top of the other. A processing tool is displayed on the display device in the real-time image and moved over the implant material so that it follows the defect contour displayed in the defect image.
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Citations
28 Claims
- 1. Method for preparing an implant from an implant material, said implant serving to fill a defect in a human or animal body, wherein a defect image of the defect having a defect contour is made available, a first calibration member arranged in or adjacent to the defect being displayed in said image, wherein a second calibration member is arranged on or adjacent to the implant material to be processed, said second calibration member corresponding to the first calibration member, wherein a real-time image of the implant material is taken and displayed in real time on a display device, wherein the defect image made available is displayed on the display device and superimposed on the real-time image in such a manner that the first and the second calibration members are displayed one on top of the other in the same shape and size and wherein a processing tool is displayed in the real-time image on the display device and moved over the implant material in such a manner that it follows the defect contour displayed in the defect image on the display device.
- 25. Device for preparing an implant from an implant material, said implant serving to fill a defect in a human or animal body, comprising an input device for transferring a defect image of the defect having a defect contour to the device, wherein a first calibration member arranged in or adjacent to the defect is displayed on the defect image, wherein a first image generating device is provided for taking a real-time image of a second calibration member arranged on or adjacent to the implant material to be processed, wherein the first calibration member corresponds to the second calibration member, wherein a display device is provided for displaying and superimposing the real-time image and the defect image, wherein the device is designed in such a manner that the first and the second calibration members are adapted to be displayed with the display device one on top of the other in the same shape and size and wherein a processing tool movable along the defect contour displayed in the defect image is adapted to be displayed at the same time with the display device in real time.
Specification