Spectrometer with multiple gratings

• US 20080309936A1
• Filed: 06/18/2007
• Published: 12/18/2008
• Est. Priority Date: 06/18/2007
• Status: Abandoned Application

• Current Assignee: Oxford Instruments Analytical OY (Oxford Instruments PLC)
• Original Assignee: Oxford Instruments Analytical OY (Oxford Instruments PLC)
• Inventors: Krapu, Mikko
• Application Number:
  US11/820,178
• Publication Number:
  US 20080309936A1
• Time in Patent Office: Days
• US Class Current: 356/328
• CPC Class Codes: G01J 3/02 Details
• CPC Class Codes: G01J 3/021 using plane or convex mirrors, parallel phase plates, or particular reflectors
• CPC Class Codes: G01J 3/0264 Electrical interface; User interface
• CPC Class Codes: G01J 3/0272 Handheld
• CPC Class Codes: G01J 3/0294 Multi-channel spectroscopy
• CPC Class Codes: G01J 3/18 using diffraction elements, e.g. grating gratings per se G02B
• CPC Class Codes: G01J 3/1838 Holographic gratings

Abstract

A spectrometric measurement apparatus comprises a collimator (401), a first diffractive grating (403), a second diffractive grating (404), and a detector arrangement (407). Incident radiation (402) from the collimator (401) is diffracted to the detector arrangement (407) either directly or through mirrors so that the first (403) and second (404) diffractive gratings diffract different wavelength ranges.

Claims

1. A spectrometric measurement apparatus for measuring intensity distributions of optical radiation, the measurement apparatus comprising:

a collimator adapted to produce a beam of incident radiation,

a first diffractive grating at a location where said first diffractive grating is adapted to receive a first part of said incident radiation,

a second diffractive grating at a location where said second diffractive grating is adapted to receive a second part of said incident radiation at the same time when said first diffractive grating receives said first part of said incident radiation, and

a detector arrangement at a location where said detector arrangement is adapted to receive radiation diffracted by said first and second diffractive gratings;

wherein at least one grating parameter of the first diffractive grating is different than a corresponding grating parameter of said second diffractive grating.

2. A spectrometric measurement apparatus according to claim 1, wherein said first and second diffractive gratings are mechanically separate pieces, the location and direction of which are set individually.

3. A spectrometric measurement apparatus according to claim 1, wherein said first and second diffractive gratings are parts of a single mechanical piece.

4. A spectrometric measurement apparatus according to claim 3, wherein said first and second diffractive gratings are two adjacent, differently patterned areas on a surface of a common substrate.

5. A spectrometric measurement apparatus according to claim 1, wherein said first and second diffractive gratings are flat-field holographic gratings.

6. A spectrometric measurement apparatus according to claim 1, wherein said detector arrangement comprises a continuous and linear array of adjacent detector elements.

7. A spectrometric measurement apparatus according to claim 6, wherein said array of adjacent detector elements is a photodiode array.

8. A spectrometric measurement apparatus according to claim 6, wherein said array of adjacent detector elements is a CCD detector.

9. A spectrometric measurement apparatus according to claim 1, comprising:

a first mirror at a location where said first mirror is adapted to reflect diffracted radiation coming from said first diffractive grating towards said detector arrangement, and

a second mirror at a location where said second mirror is adapted to reflect diffracted radiation coming from said second diffractive grating towards said detector arrangement.

10. A spectrometric measurement apparatus according to claim 9, wherein said first and second mirrors are mechanically separate pieces, the location and direction of which are set individually.

11. A spectrometric measurement apparatus according to claim 1, wherein:

said first diffractive grating is adapted to diffract parts of the incident radiation having at least wavelengths of 174 nanometres, 178 nanometres, and 180 nanometres towards the detector arrangement either directly or reflected through a mirror, and

said second diffractive grating is adapted to diffract parts of the incident radiation having wavelengths that are longer than those diffracted by the first diffractive grating towards the detector arrangement either directly or reflected through a mirror.

12. A spectrometric measurement apparatus according to claim 1, wherein the spectrometric measurement apparatus is contained in a hand-held measurement unit adapted to produce electric discharges at a surface of a sample, so that optical radiation from a produced discharge is adapted to be directed to said collimator for producing said beam of incident radiation.