PROGRAMMING RATE IDENTIFICATION AND CONTROL IN A SOLID STATE MEMORY
First Claim
1. A method for programming rate identification and control in a solid state memory comprising an array of memory cells having columns of memory cell coupled to bit lines, the method comprising:
- identifying memory cells of the array that program at a faster rate than the remaining memory cells of the array; and
causing the memory cells that program at the faster rate to reach their respective programmed states at a substantially similar programming rate as the remaining memory cells by adjusting biasing of selected bit lines.
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Accused Products
Abstract
Memory devices adapted to receive and transmit analog data signals representative of bit patterns of two or more bits facilitate increases in data transfer rates relative to devices communicating data signals indicative of individual bits. Programming of such memory devices includes determining a rate of programming (i.e., rate of movement of the respective threshold voltage) of the memory cells and biasing the corresponding bit line with a programming rate control voltage that is greater than the bit line enable voltage and less than the inhibit voltage. This voltage can be adjusted to change the speed of programming. A capacitor coupled to the bit line stores the programming rate control voltage in order to maintain the proper bit line bias for the duration of the programming operation or until it is desired to change the programming rate.
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Citations
30 Claims
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1. A method for programming rate identification and control in a solid state memory comprising an array of memory cells having columns of memory cell coupled to bit lines, the method comprising:
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identifying memory cells of the array that program at a faster rate than the remaining memory cells of the array; and causing the memory cells that program at the faster rate to reach their respective programmed states at a substantially similar programming rate as the remaining memory cells by adjusting biasing of selected bit lines. - View Dependent Claims (2, 3, 4, 5, 6)
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7. A method for controlling programming rates of memory cells in a solid state memory comprising a plurality of bit lines coupled to columns of memory cells, the method comprising:
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identifying a programming rate for each of the memory cells to determine faster programming memory cells and slower programming memory cells; storing an indication of a location of each faster programming memory cell; and changing the programming rate of the faster programming memory cells by increasing a selected bit line bias voltage, coupled to the faster programming memory cells, such that the bias voltage is greater than a bit line enable voltage. - View Dependent Claims (8, 9, 10)
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11. A method for controlling programming rates of memory cells in a non-volatile solid state memory comprising a plurality of bit line columns of memory cells, the method comprising:
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determining a programming rate for each of the memory cells such that the memory cells are either faster programming memory cells or slower programming memory cells; and programming, substantially simultaneously, a faster programming memory cell and a slower programming memory cell while adjusting the programming rate of the faster programming memory cell in response to biasing a selected bit line coupled to the faster programming memory cell with a voltage that is greater than an enable voltage such that the slower programming memory cell and the faster programming memory cell reach their respective programmed states substantially simultaneously. - View Dependent Claims (12, 13, 14, 15, 16)
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17. A method for controlling programming rate of memory cells in a non-volatile solid state memory comprising a plurality bit lines, each bit line coupled to a column of memory cells, the method comprising:
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reading a first threshold voltage prior to a first programming pulse for each of the memory cells; applying the first programming pulse to each of the memory cells; reading a second threshold voltage after the first programming pulse for each of the memory cells; determining a difference between the first and second threshold voltages to find faster programming memory cells and slower programming memory cells wherein the faster programming memory cells have a greater difference between the first and second threshold voltages than the slower programming memory cells; and biasing a selected bit line, coupled to each of the faster programming memory cells, with a voltage that is greater than an enable voltage and less than an inhibit voltage such that the programming rate of the faster programming memory cells is decreased. - View Dependent Claims (18, 19)
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20. A method for controlling programming of memory cells in a non-volatile solid state memory comprising a plurality of bit line columns and a plurality of word line rows, the method comprising:
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biasing a selected word line coupled to the memory cells with a programming pulse; reading an analog threshold voltage for each of the memory cells; determining faster programming memory cells having an analog threshold voltage greater than a predetermined threshold and slower programming memory cells having an analog threshold voltage less than the predetermined threshold; and biasing first selected bit lines coupled to the faster programming memory cells with a voltage greater than an enable voltage and less than an inhibit voltage and second selected bit lines coupled to the slower programming memory cells with the enable voltage such that each of the memory cells coupled to the selected word line that are being programmed reach their respective programmed state threshold voltage substantially simultaneously. - View Dependent Claims (21)
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22. A method for programming memory cells in a non-volatile, solid state memory organized in a plurality of bit line columns and a plurality of word line rows, the method comprising:
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receiving a program command comprising a received memory cell address and a data value having a programmed state; if the received memory cell address is equal to a stored memory cell address of a faster programming memory, reading stored bit line voltage data, associated with the stored memory cell address, from memory; and biasing a selected bit line coupled to the received memory cell address in response to the stored bit line voltage data. - View Dependent Claims (23)
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24. A solid state memory device, comprising:
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an array of non-volatile memory cells having columns of memory cells coupled to bit lines and rows of memory cells coupled to word lines; and circuitry for control and access of the array of non-volatile memory cells wherein the circuitry for control and access is adapted to control a rate of programming of the array of non-volatile memory cells by generating a selected bit line bias greater than an enable voltage and in response to a rate of change of a threshold voltage of each of the memory cells. - View Dependent Claims (25, 26, 27, 28)
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29. A method for identifying and controlling programming rate in a solid state memory having an array of memory cells, the method comprising:
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identifying memory cells of the array that program at a faster rate than the remaining memory cells of the array; and causing the memory cells that program at the faster rate to reach their respective programmed states substantially simultaneously with the remaining memory cells reaching their respective programmed states. - View Dependent Claims (30)
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Specification