ENHANCED SAMPLE PROCESSING DEVICES, SYSTEMS AND METHODS
First Claim
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1. A method of processing sample material comprising:
- providing a device comprising a process chamber array, wherein the process chamber array comprises a first chamber and a second chamber;
providing sample material in the process chamber array;
moving the sample material within the process chamber array by rotating the device;
providing paramagnetic particles within the sample material located in the process chamber array;
locating a magnet proximate the device; and
rotating the device such that the paramagnetic particles within the sample material in the process chamber array are subjected to the magnetic field of the magnet during the rotating.
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Abstract
Devices, systems, and methods for processing sample materials. The sample materials may be located in a plurality of process chambers in the device, which is rotated during heating of the sample materials.
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Citations
25 Claims
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1. A method of processing sample material comprising:
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providing a device comprising a process chamber array, wherein the process chamber array comprises a first chamber and a second chamber; providing sample material in the process chamber array; moving the sample material within the process chamber array by rotating the device; providing paramagnetic particles within the sample material located in the process chamber array; locating a magnet proximate the device; and rotating the device such that the paramagnetic particles within the sample material in the process chamber array are subjected to the magnetic field of the magnet during the rotating. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15)
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16. A method of processing sample material comprising:
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providing a device comprising a process chamber array that comprises a first chamber and a second chamber; providing sample material in the process chamber array; providing paramagnetic particles within the sample material located in the process chamber array; locating a magnet proximate the device; and rotating the device about an axis of rotation such that the paramagnetic particles within the sample material in the process chamber array are subjected to the magnetic field of the magnet during the rotating, wherein the rotating comprises varying the speed of rotation such that the device is rotated through at least two cycles of acceleration and deceleration; wherein the magnet is located between the paramagnetic particles and the axis of rotation; and wherein the paramagnetic particles within the sample material in the at least one process chamber array are subjected to forces pulling in opposite directions intermittently. - View Dependent Claims (17, 18, 19, 20, 21, 22, 23, 24)
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25. A method of processing sample material comprising:
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providing a device comprising a process chamber array that comprises a first chamber and a second chamber; providing sample material in the process chamber array; thermal processing of the sample material in the process chamber array by controlling the temperature of the sample material in the process chamber array; moving the sample material within the process chamber array by rotating the device; providing paramagnetic particles within the sample material located in the process chamber array; locating a magnet proximate the device; and rotating the device about an axis of rotation; wherein the paramagnetic particles within the sample material in the process chamber array are intermittently subjected to the magnetic field of the magnet during the rotating; wherein the rotating comprises varying the speed of rotation such that the device is rotated through at least two cycles of acceleration and deceleration; wherein the magnet does not rotate with the device when the device is rotating; and wherein the magnet is located between the paramagnetic particles and the axis of rotation.
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Specification