METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE HAVING POROUS LOW DIELECTRIC CONSTANT LAYER FORMED FOR INSULATION BETWEEN METAL LINES
First Claim
Patent Images
1. A method for manufacturing a semiconductor device, comprising the step of:
- forming a porous low dielectric constant layer for insulation between metal lines,wherein the porous low dielectric constant layer comprises an insulation layer including fillers.
1 Assignment
0 Petitions
Accused Products
Abstract
The present invention related to a method for manufacturing a semiconductor device. More particularly, this method describes how to manufacture a semiconductor device having a porous, low dielectric constant layer formed between metal lines, comprising an insulation layer enveloping fillers.
-
Citations
23 Claims
-
1. A method for manufacturing a semiconductor device, comprising the step of:
forming a porous low dielectric constant layer for insulation between metal lines, wherein the porous low dielectric constant layer comprises an insulation layer including fillers. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11)
-
12. A method for manufacturing a semiconductor device, comprising the steps of:
-
forming a porous low dielectric constant layer including fillers on a semiconductor substrate which is formed with a lower metal line; etching the porous low dielectric constant layer so as to expose the lower metal line and defining a metal line forming region in which an upper metal line is to be formed; and filling a metal layer in the metal line forming region so as to form an upper metal line which comes into contact with the lower metal line. - View Dependent Claims (13, 14, 15, 16, 17, 18, 19, 20, 21, 22, 23)
-
Specification