FEATURE EXTRACTION THAT SUPPORTS PROGRESSIVELY REFINED SEARCH AND CLASSIFICATION OF PATTERNS IN A SEMICONDUCTOR LAYOUT
First Claim
1. A method of identifying patterns in a semiconductor layout, the method comprising:
- specifying a target region by indicating polygonal regions on a mask layer;
generating a target vector using a two dimensional (2D) low discrepancy sequence;
identifying layout regions in a design layout;
generating a feature vector for a layout region;
comparing a subset of sequence derived feature values in the target vector with sequence derived feature values in a search region feature vector as an initial filter;
determining that the layout region does not contain a match if a comparison of the subset of sequence derived feature values in the target vector with corresponding values in the search region feature vector falls below a threshold; and
outputting search results.
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Abstract
A system, method and program product for searching and classifying patterns in a VLSI design layout. A method is provided that includes generating a target vector using a two dimensional (2D) low discrepancy sequence; identifying layout regions in a design layout; generating a feature vector for a layout region; comparing a subset of sequence values in the target vector with sequence values in the feature vector as an initial filter, wherein the system for comparing determines that the layout region does not contain a match if a comparison of the subset of sequence values in the target vector with sequence values in the feature vector falls below a threshold; and outputting search results.
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Citations
12 Claims
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1. A method of identifying patterns in a semiconductor layout, the method comprising:
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specifying a target region by indicating polygonal regions on a mask layer; generating a target vector using a two dimensional (2D) low discrepancy sequence; identifying layout regions in a design layout; generating a feature vector for a layout region; comparing a subset of sequence derived feature values in the target vector with sequence derived feature values in a search region feature vector as an initial filter; determining that the layout region does not contain a match if a comparison of the subset of sequence derived feature values in the target vector with corresponding values in the search region feature vector falls below a threshold; and outputting search results. - View Dependent Claims (2, 3, 4)
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5. A system for identifying patterns in a semiconductor layout, comprising:
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a system for generating a target vector using a two dimensional (2D) low discrepancy sequence to select anchor points for measuring features in a design layout; a system for identifying layout regions in the design layout; a system for generating a feature vector for a layout region; a system for comparing a subset of sequence derived feature values in the target vector with sequence derived values in a search region feature vector as an initial filter, wherein the system for comparing determines that the layout region does not contain a match if a comparison of the subset of sequence derived feature values in the target vector with sequence derived values in the feature vector falls below a threshold; and a system for outputting search results. - View Dependent Claims (6, 7, 8)
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9. A computer program product stored on a computer readable medium for identifying patterns in a semiconductor layout, which when executed causes a computer system to perform functions comprising:
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generating a target vector using a two dimensional (2D) low discrepancy sequence; identifying layout regions in a design layout; generating a feature vector for a layout region; comparing a subset of sequence derived feature values in the target vector with sequence derived feature values in a search region vector as an initial filter, wherein the comparing determines that the layout region does not contain a match if a comparison of the subset of sequence derived feature values in the target vector with corresponding sequence derived feature values in the search region vector falls below a threshold; and outputting search results. - View Dependent Claims (10, 11, 12)
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Specification