SEMICONDUCTOR DEVICE HAVING FLOATING BODY ELEMENT AND BULK BODY ELEMENT AND METHOD OF MANUFACTURING THE SAME
First Claim
1. A semiconductor device comprising:
- a substrate including a bulk body element region and a floating body element region;
an isolation region defining an active region of the bulk body element region of the substrate and defining first buried patterns and first active patterns, which are sequentially stacked on a first element region of the floating body element region of the substrate; and
a first buried dielectric layer between the first buried patterns and the substrate and between the first buried patterns and the first active patterns.
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Abstract
A semiconductor device having a floating body element and a bulk body element and a manufacturing method thereof are provided. The semiconductor device includes a substrate having a bulk body element region and floating body element regions. An isolation region defining an active region of the bulk body element region of the substrate and defining first buried patterns and first active patterns, which are sequentially stacked on a first element region of the floating body element regions of the substrate is provided. A first buried dielectric layer interposed between the first buried patterns and the substrate and between the first buried patterns and the first active patterns is provided.
40 Citations
25 Claims
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1. A semiconductor device comprising:
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a substrate including a bulk body element region and a floating body element region; an isolation region defining an active region of the bulk body element region of the substrate and defining first buried patterns and first active patterns, which are sequentially stacked on a first element region of the floating body element region of the substrate; and a first buried dielectric layer between the first buried patterns and the substrate and between the first buried patterns and the first active patterns. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12)
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13. A semiconductor device comprising:
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buried patterns on a substrate; at least one connection extending from the buried patterns and connecting the buried patterns to each other; active patterns on the buried patterns; a buried dielectric layer between the buried patterns and the substrate, between the buried patterns and the active patterns, between the at least one connection and the substrate and between the at least one connection and the active patterns; and at least one gate structure directly on the active patterns. - View Dependent Claims (14, 15, 16, 17, 18, 19, 20)
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21. A method of manufacturing a semiconductor device, comprising:
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preparing a substrate having a bulk body element region and floating body element regions; forming an isolation region defining an active region of the bulk body element region of the substrate, and defining first sacrificial patterns and first active patterns, which are sequentially stacked on a first element region of the floating body element regions of the substrate; forming a first recessed region partially exposing the first sacrificial patterns in the isolation region using a photolithography and etching process; removing the first sacrificial patterns to form first empty spaces below the first active patterns; forming a first buried dielectric layer on an inner wall of the first empty space and an inner wall of the first recessed region; and forming first buried patterns filling at least the first empty spaces on the substrate having the first buried dielectric layer. - View Dependent Claims (22)
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23. A method of manufacturing a semiconductor device, comprising:
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forming a sacrificial layer and an active layer, which are sequentially stacked, on a substrate; patterning the sacrificial layer and the active layer to form sacrificial patterns and active patterns, which are sequentially stacked; forming an isolation region surrounding the sacrificial patterns and the active patterns, which are sequentially stacked; forming a recessed region in the isolation region to partially expose a sidewall of each of the sacrificial patterns; selectively removing the sacrificial patterns to form empty spaces below the active patterns; forming a buried dielectric layer on an inner wall of the empty spaces and an inner wall of the recessed region; forming a buried layer filling the empty spaces and the recessed region on the substrate having the buried dielectric layer; partially etching the buried layer to form buried patterns remaining in the empty spaces and a connection remaining in the recessed region to connect the buried patterns to each other; and forming at least one gate structure on the active patterns. - View Dependent Claims (24)
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25. A method of manufacturing a semiconductor device, comprising:
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forming a sacrificial layer and an active layer, which are sequentially stacked, on a substrate; patterning the sacrificial layer and the active layer to form sacrificial patterns and preliminary active patterns, which are sequentially stacked; forming an isolation region surrounding the sacrificial patterns and the preliminary active patterns, which are sequentially stacked; forming a recessed region in the isolation region to partially expose a sidewall of each of the sacrificial patterns; selectively removing the sacrificial patterns having the exposed sidewall to form empty spaces below the preliminary active patterns; forming a buried dielectric layer on an inner wall of the empty spaces and an inner wall of the recessed region; forming buried patterns filling the empty spaces on the substrate having the buried dielectric layer; patterning the preliminary active patterns to form a plurality of active patterns on each of the buried patterns; and forming at least one gate structure on the active patterns.
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Specification