THIN FILM TRANSISTORS AND FABRICATION METHODS
First Claim
1. A method of fabricating a semiconductor thin film device, the method including:
- depositing a first amorphous silicon layer on a substrate;
patterning and etching the first amorphous silicon layer;
depositing a first dielectric layer;
patterning and etching the first dielectric layer, the etched region including a buried contact region on the first amorphous silicon layer;
depositing a second amorphous silicon layer;
patterning and etching the second amorphous silicon layer;
depositing a second dielectric layer;
etching the second dielectric layer to define dielectric spacer regions adjacent to second amorphous silicon geometry side walls;
depositing a metallic material for the purpose of silicide formation of first and second amorphous silicon material; and
silicide formation of the metallic material, wherein the second amorphous silicon layer is fully silicided in the buried contact region, and wherein the first amorphous silicon layer is partially or fully silicided in the buried contact region.
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0 Petitions
Accused Products
Abstract
A method of fabricating a low temperature semiconductor thin film device is described. The method includes: forming one or more metal lines on a substrate; forming a conductive contact to a said metal line; forming a thin film device having: a first amorphous silicon region, wherein a portion of the region covers a said conductive contact; and a gate dielectric layer; and a second amorphous silicon layer; forming a silicide of first and second amorphous silicon material with a deposited metallic material; depositing an insulating material; and forming conductive contacts and top metal interconnects to couple said first and second amorphous silicon regions.
93 Citations
20 Claims
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1. A method of fabricating a semiconductor thin film device, the method including:
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depositing a first amorphous silicon layer on a substrate; patterning and etching the first amorphous silicon layer; depositing a first dielectric layer; patterning and etching the first dielectric layer, the etched region including a buried contact region on the first amorphous silicon layer; depositing a second amorphous silicon layer; patterning and etching the second amorphous silicon layer; depositing a second dielectric layer; etching the second dielectric layer to define dielectric spacer regions adjacent to second amorphous silicon geometry side walls; depositing a metallic material for the purpose of silicide formation of first and second amorphous silicon material; and silicide formation of the metallic material, wherein the second amorphous silicon layer is fully silicided in the buried contact region, and wherein the first amorphous silicon layer is partially or fully silicided in the buried contact region. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9)
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10. A method of fabricating a semiconductor thin film device, including:
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forming one or more metal lines on a substrate; depositing a first dielectric material to isolate the metal lines; planarizing the first dielectric surface; patterning and etching the first dielectric layer to form first contact openings; depositing one or more barrier materials and tungsten to fill the first contacts; polishing the tungsten material to form tungsten plugs in the contact regions; depositing a first amorphous silicon layer; patterning and etching the first amorphous silicon layer, the remaining silicon regions including a region covering a said first contact opening having tungsten material; depositing a second dielectric layer; depositing a second amorphous silicon layer; patterning and etching the second amorphous silicon layer; depositing a third dielectric layer; patterning and etching the third dielectric layer to define second contact regions; depositing a top metal for the purpose of forming interconnects; and patterning and etching the top metal, wherein the top metal interconnects couple first and second silicon regions. - View Dependent Claims (11, 12, 13, 14, 15, 16, 17, 18)
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19. A method of fabricating a low temperature semiconductor thin film device, including:
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forming one or more metal lines on a substrate; forming a conductive contact to a said metal line; forming a thin film device having; a first amorphous silicon region, wherein a portion of the region covers a said conductive contact; and a gate dielectric layer; and a second amorphous silicon layer; forming a silicide of first and second amorphous silicon material with a deposited metallic material; depositing an insulating material; and forming conductive contacts and top metal interconnects to couple said first and second amorphous silicon regions. - View Dependent Claims (20)
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Specification