CONTOUR MEASURING PROBE
First Claim
1. A contour measuring probe, comprising:
- at least one guide;
a movable rack having;
a tip extension for touching a surface of an object, the tip extension being linearly movable relative to the at least one guide; and
at least one driving member partly running through the at least one guide and linearly slidable in the at least one guide, wherein a gravitational force acting on the movable rack pushes the tip extension to move towards the object;
a counter-balancing mechanism for partially counter balancing the gravitational force acting on the movable rack;
a linear measuring scale configured to display values of displacements of the tip extension, the linear measuring scale being fixed relative to one of the at least one guide and the tip extension; and
a displacement sensor configured to detect and read the displacement values of the tip extension displayed by the linear measuring scale, the displacement sensor being fixed relative to the other one of the at least one guide and the tip extension.
2 Assignments
0 Petitions
Accused Products
Abstract
An exemplary contour measuring probe includes a guide (12), a movable rack, a counter-balancing mechanism, a linear measuring scale (24), and a displacement sensor (26). The movable rack comprises a tip extension (20) for touching a surface of an object. The tip extension (20) is pushed to move towards the object under a gravitational force acting on the movable rack. The counter-balancing mechanism is configured to partially counter balance the gravitational force acting on the movable rack. The linear measuring scale (24) displays values of displacements of the tip extension (20). The displacement sensor (26) detects and reads the displacement values displayed by the linear measuring scale (24).
-
Citations
20 Claims
-
1. A contour measuring probe, comprising:
-
at least one guide; a movable rack having; a tip extension for touching a surface of an object, the tip extension being linearly movable relative to the at least one guide; and at least one driving member partly running through the at least one guide and linearly slidable in the at least one guide, wherein a gravitational force acting on the movable rack pushes the tip extension to move towards the object; a counter-balancing mechanism for partially counter balancing the gravitational force acting on the movable rack; a linear measuring scale configured to display values of displacements of the tip extension, the linear measuring scale being fixed relative to one of the at least one guide and the tip extension; and a displacement sensor configured to detect and read the displacement values of the tip extension displayed by the linear measuring scale, the displacement sensor being fixed relative to the other one of the at least one guide and the tip extension. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18)
-
-
19. A contour measuring probe, comprising:
-
a movable rack including a tip extension for touching a surface of an object, the tip extension being pushed to move towards the object under a gravitational force acting on the movable rack; and a counter-balancing mechanism for partially counter balancing the gravitational force acting on the movable rack. - View Dependent Claims (20)
-
Specification