Variably dimensioned capacitance sensor elements

• US 20090021267A1
• Filed: 07/17/2006
• Published: 01/22/2009
• Est. Priority Date: 07/17/2006
• Status: Active Grant

• Current Assignee: Synaptics Incorporated
• Original Assignee: Synaptics Incorporated
• Inventors: MacKey, Bob Lee, Golovchenko, Mykola
• Granted Patent: US 7,688,080 B2
• Time in Patent Office: Days
• US Class Current: 324/686
• CPC Class Codes: G01D 5/24 by varying capacitance

Abstract

A capacitance sensing apparatus includes capacitance sensor elements covered by a layer of material. The layer of material has an uneven effect on a measure of capacitance induced in the capacitance sensor elements when an object is in proximity to a sensing surface. For example, the layer of material may have a non-uniform thickness, or a property of the material may be non-uniform across the layer. The capacitance sensor elements are dimensioned to compensate for the effect.

Claims

1. A capacitance sensing apparatus comprising:

a layer of material; and

a first capacitance sensor element covered by said layer of material, said first capacitance sensor element configured to sense a capacitance induced when an object is proximate to a sensing surface;

wherein said layer of material has an uneven effect on a measure of capacitance, wherein said first capacitance sensor element is dimensioned to compensate for said effect.

2. The apparatus of claim 1 wherein said first capacitance sensor element has a width that varies along its length.

3. The apparatus of claim 1 wherein said layer of material has a non-uniform thickness, wherein a dimension of said first capacitance sensor element varies in correspondence with variations in said thickness.

4. The apparatus of claim 1 wherein said sensing surface has a shape that is not uniformly flat, wherein said layer of material conforms to said shape and wherein a dimension of said first capacitance sensor element varies in correspondence with said shape.

5. The apparatus of claim 1 wherein a property of said layer of material is non-uniform across said layer, wherein said property is selected from the group consisting of:

hardness, permittivity, dielectric constant, and density; and

wherein a dimension of said first capacitance sensor element varies in correspondence with variations in said property.

6. The apparatus of claim 1 wherein said layer of material comprises more than one type of material.

7. The apparatus of claim 1 wherein said material is selected from the group consisting of:

a fluid, a gas, a polymer, a plastic, and a foam.

8. The apparatus of claim 1 further comprising a second capacitance sensor element configured to sense a capacitance induced when said object is proximate to said sensing surface, wherein said second capacitance sensor element is dimensioned to compensate for said effect and wherein said second capacitance sensor element is sized differently than said first capacitance sensor element.

9. The apparatus of claim 1 further comprising:

a second capacitance sensor element; and

a conductor disposed between said first and second capacitance sensor elements, wherein said conductor is coupled to a shield.

10. The apparatus of claim 1 further comprising a conductor adjacent to said first capacitance sensor element, wherein said conductor is coupled to a shield.

11. The apparatus of claim 10 further comprising a second capacitance sensor element within said conductor.

12. The apparatus of claim 1 operable for determining an unambiguous location of said object.

13. The apparatus of claim 1 operable for sensing motion of said object.

14. A capacitance sensing apparatus for sensing an object proximate to a capacitance sensing surface, said apparatus comprising:

a first capacitance sensor element; and

a second capacitance sensor element, wherein said first capacitance sensor element has a size that is different from that of said second capacitance sensor element;

wherein dimensions of said first and second capacitance sensor elements are selected such that a first background capacitance, if measured by said first capacitance sensor element in the absence of said object, and a second background capacitance, if measured by said second capacitance sensor element in the absence of said object, are substantially equal.

15. The apparatus of claim 14 wherein said first and second capacitance sensor elements have widths that vary with their respective lengths.

16. The apparatus of claim 14 further comprising a conductor disposed between said first and second capacitance sensor elements, wherein said conductor is coupled to a shield.

17. The apparatus of claim 14 further comprising a conductor adjacent to said first capacitance sensor element, wherein said conductor is coupled to a shield and wherein said second capacitance sensor element is disposed within said conductor.

18. A capacitance sensing apparatus comprising:

a reference sensing surface;

a first capacitance sensor element traversed by said sensing surface, said first capacitance sensor element configured to sense a capacitance induced when an object is proximate to said sensing surface; and

a layer of material disposed between said sensing surface and said first capacitance sensor element, wherein an attribute of said layer of material is non-uniform across said layer such that said layer of material has an uneven effect on capacitance;

wherein if said object is at a first position on said sensing surface, a first capacitance is induced, and if said object is at a second position on said sensing surface, a second capacitance is induced; and

wherein said first capacitance sensor element is dimensioned to compensate for said effect such that said first and second capacitances are substantially equal.

19. The apparatus of claim 18 wherein said first capacitance sensor element has a width that varies with length.

20. The apparatus of claim 18 wherein said layer of material has a non-uniform thickness, wherein a dimension of said first capacitance sensor element varies in correspondence with variations in said thickness.

21. The apparatus of claim 18 wherein said sensing surface has a shape that is not uniformly flat, wherein said layer of material conforms to said shape and wherein a dimension of said first capacitance sensor element varies in correspondence with said shape.

22. The apparatus of claim 18 wherein said attribute comprises a property selected from the group consisting of:

hardness, permittivity, dielectric constant, and density; and

wherein a dimension of said first capacitance sensor element varies in correspondence with variations in said property.

23. The apparatus of claim 18 wherein said layer of material comprises more than one type of material.

24. The apparatus of claim 18 wherein said material is selected from the group consisting of:

a fluid, a gas, a polymer, a plastic, and a foam.

25. The apparatus of claim 18 further comprising a second capacitance sensor element configured to sense a capacitance induced when said object is proximate to said sensing surface, wherein said second capacitance sensor element is dimensioned to compensate for said effect and wherein said second capacitance sensor element is sized differently than said first capacitance sensor element.

26. The apparatus of claim 18 further comprising:

a second capacitance sensor element; and

a conductor disposed between said first and second capacitance sensor elements, wherein said conductor is coupled to a shield.

27. The apparatus of claim 18 further comprising a conductor adjacent to said first capacitance sensor element, wherein said conductor is coupled to a shield.

28. The apparatus of claim 27 further comprising a second capacitance sensor element within said conductor.

29. The apparatus of claim 18 operable for determining an unambiguous location of said object.

30. The apparatus of claim 18 operable for sensing motion of said object.