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Structure for a Phase Locked Loop with Adjustable Voltage Based on Temperature

  • US 20090021314A1
  • Filed: 05/29/2008
  • Published: 01/22/2009
  • Est. Priority Date: 07/20/2007
  • Status: Active Grant
First Claim
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1. A design structure embodied in a machine readable medium for designing, manufacturing, or testing an integrated circuit, the design structure comprising:

  • one or more first design structure elements representing one or more thermal sensors provided on an integrated circuit device;

    a second design structure element representing a thermal monitoring mechanism coupled to the one or more thermal sensors; and

    a third design structure element representing a phase locked loop (PLL) circuit coupled to the thermal monitoring mechanism, wherein the one or more thermal sensors are configured for use in controlling an operation of the integrated circuit device and an operation of the PLL circuit, and wherein the design structure is configured such that;

    an operational temperature of the integrated circuit device associated with the PLL circuit is sensed with the one or more thermal sensors provided on the integrated circuit device, andan operation of the PLL circuit is controlled based on the operational temperature sensed by the one or more thermal sensors.

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