×

Method and System for GRR Testing

  • US 20090024324A1
  • Filed: 07/20/2007
  • Published: 01/22/2009
  • Est. Priority Date: 07/20/2007
  • Status: Abandoned Application
First Claim
Patent Images

1. A method of testing semiconductor devices, the method comprising:

  • providing a plurality of semiconductor devices in a device tray;

    automatically moving a first subset of the plurality of semiconductor devices from the device tray to a load board, the first subset of the plurality of semiconductor devices being arranged in a first arrangement in the load board, the load board having multiple test sites;

    performing a set of tests on the first subset of the plurality of semiconductor devices;

    automatically rearranging the first subset of the plurality of semiconductor devices from the first arrangement to a second arrangement; and

    repeating the one or more tests.

View all claims
  • 1 Assignment
Timeline View
Assignment View
    ×
    ×