Method and System for GRR Testing
First Claim
1. A method of testing semiconductor devices, the method comprising:
- providing a plurality of semiconductor devices in a device tray;
automatically moving a first subset of the plurality of semiconductor devices from the device tray to a load board, the first subset of the plurality of semiconductor devices being arranged in a first arrangement in the load board, the load board having multiple test sites;
performing a set of tests on the first subset of the plurality of semiconductor devices;
automatically rearranging the first subset of the plurality of semiconductor devices from the first arrangement to a second arrangement; and
repeating the one or more tests.
1 Assignment
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Accused Products
Abstract
A method and a system for automatically performing gauge repeatability and reproducibility (GRR) tests is provided. A handler is used to automatically move semiconductor devices from a device tray or other storage device into position for testing. When operating in a GRR mode, the handler is configured to place each of the semiconductor devices being tested in each possible testing position. A series of tests is performed on each of the semiconductor devices being tested in each of the possible testing positions. Furthermore, the series of tests may be repeated multiple times for each of the semiconductor devices in each position. In this embodiment, it is preferred that the semiconductor devices be reseated after each completing each series of tests. The semiconductor devices may be individual dies, systems on chips, multi-chip modules, or wafers.
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Citations
20 Claims
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1. A method of testing semiconductor devices, the method comprising:
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providing a plurality of semiconductor devices in a device tray; automatically moving a first subset of the plurality of semiconductor devices from the device tray to a load board, the first subset of the plurality of semiconductor devices being arranged in a first arrangement in the load board, the load board having multiple test sites; performing a set of tests on the first subset of the plurality of semiconductor devices; automatically rearranging the first subset of the plurality of semiconductor devices from the first arrangement to a second arrangement; and repeating the one or more tests. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8)
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9. A test system comprising:
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a controller communicatively coupled to a handler; an IC tester communicatively coupled to the controller, the IC tester being configured to test a semiconductor device in a plurality of positions; and a handler communicatively coupled to at least one of the controller and the IC tester, at least one of the controller and IC tester providing instructions to the handler to automatically retrieve each of a plurality of semiconductor devices for testing by the IC tester in each available position. - View Dependent Claims (10, 11, 12, 13, 14)
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15. A computer program product for testing a plurality of semiconductor devices, the computer program product having a medium with a computer program embodied thereon, the computer program product comprising:
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(A) computer program code for causing a handler to move a first set of the semiconductor devices from a first arrangement at a first location to a second arrangement at a second location, the second location having a plurality of test sites; (B) computer program code for removing the first set of semiconductor devices from the second location and replacing the first set of semiconductor devices in the second location; (C) computer program code for moving the first set of semiconductor devices from the second arrangement to a third arrangement at the second location; and (D) computer program code for repeating (B)-(C) until each of the first set of semiconductor devices have been tested in each of the plurality of test sites. - View Dependent Claims (16, 17, 18, 19, 20)
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Specification