Integrated circuit design based on scan design technology
First Claim
Patent Images
1. An integrated circuit comprising:
- a scan chain including a scan flip-flop and a dummy block,wherein said dummy block has a clock terminal receiving a clock signal, a scan input terminal connected to a scan data line within said scan chain, and a scan output terminal connected to another scan data line within said scan chain, andwherein said dummy block is configured to output data on said scan output terminal in response to input data fed to said scan input terminal, not responsively to said clock signal.
2 Assignments
0 Petitions
Accused Products
Abstract
An integrated circuit is provided with a scan chain including a scan flip-flop and a dummy block. The dummy block has a clock terminal receiving a clock signal, a scan input terminal connected to a scan data line within the scan chain, and a scan output terminal connected to another scan data line within the scan chain. The dummy block is configured to output data on the scan output terminal in response to input data fed to the scan input terminal, not responsively to the clock signal.
-
Citations
15 Claims
-
1. An integrated circuit comprising:
-
a scan chain including a scan flip-flop and a dummy block, wherein said dummy block has a clock terminal receiving a clock signal, a scan input terminal connected to a scan data line within said scan chain, and a scan output terminal connected to another scan data line within said scan chain, and wherein said dummy block is configured to output data on said scan output terminal in response to input data fed to said scan input terminal, not responsively to said clock signal. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9)
-
-
10. An integrated circuit design method comprising:
-
placing cells including a scan flip-flop cell and a dummy block cell; implementing clock tree synthesis for said scan flip-flop cell and said dummy block cell; and implementing routing for said cells so that a scan chain including said scan flip-flop and said dummy block cell is formed, wherein said dummy block cell has a clock terminal receiving a clock signal, a scan input terminal connected to a scan data line within said scan chain, and a scan output terminal connected to another scan data line within said scan chain, wherein said dummy block cell is configured to output data on said scan output terminal in response to input data fed to said scan input terminal, not responsively to said clock signal. - View Dependent Claims (11, 12, 13, 14, 15)
-
Specification