Exposure apparatus, substrate processing method, and device producing method
First Claim
Patent Images
1. An exposure apparatus which exposes a substrate by radiating an exposure light onto the substrate on which a thin film is formed, the exposure apparatus comprising a detector which detects a state of formation of the thin film on the substrate.
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Abstract
An exposure apparatus includes a detector which detects a defect in a thin film formed on a substrates. When the detector is provided for liquid immersion exposure in which the substrate is exposed through liquid, outflow of the liquid due to by any defect in the thin film is detected before the liquid outflows, thereby suppressing reduction in throughput in producing device and preventing any problem or inconvenience from occurring in the exposure apparatus.
39 Citations
52 Claims
- 1. An exposure apparatus which exposes a substrate by radiating an exposure light onto the substrate on which a thin film is formed, the exposure apparatus comprising a detector which detects a state of formation of the thin film on the substrate.
- 15. An exposure apparatus which exposes a substrate by radiating an exposure light onto the substrate through a liquid, the exposure apparatus comprising a detector which detects a state of an edge of the substrate.
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31. An exposure apparatus which exposes a substrate by radiating, through a liquid, an exposure light onto the substrate on which a thin film is formed, the exposure apparatus comprising:
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an optical system which is arranged in an optical path for the exposure light; and a detector which detects a defect of the thin film of the substrate to which the liquid is provided. - View Dependent Claims (32, 33, 34, 35, 36, 37, 38, 39, 51)
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41. A method for processing a substrate, on which a film is formed, for exposure-processing the substrate, the method comprising:
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holding the substrate by a substrate-holding member; radiating an exposure light through a liquid onto the substrate held by the substrate-holding member to exposure-process the substrate; and detecting a state of the film of the substrate before radiating the exposure light onto the substrate. - View Dependent Claims (42, 43, 44, 49)
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45. A method for processing a substrate to be exposed through a liquid, the method comprising:
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forming a thin film on the substrate; inspecting a defect of the thin film; supplying the liquid onto the thin film; and radiating an exposure light onto the substrate through the supplied liquid. - View Dependent Claims (46, 47, 48, 52)
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Specification