CHARGED PARTICLE IRRADIATION SYSTEM

• US 20090039256A1
• Filed: 06/18/2008
• Published: 02/12/2009
• Est. Priority Date: 06/22/2007
• Status: Active Grant

• Current Assignee: Hitachi, Ltd.
• Original Assignee: Hitachi, Ltd.
• Inventors: FUJII, Yusuke, Fujimaki, Hisataka, Hiramoto, Kazuo
• Granted Patent: US 7,838,855 B2
• Time in Patent Office: Days
• US Class Current: 250/306
• CPC Class Codes: A61N 2005/1087 Ions; Protons
• CPC Class Codes: A61N 5/1048 Monitoring, verifying, controlling systems and methods
• CPC Class Codes: G21K 5/04 with beam-forming means

Abstract

A charged particle irradiation system that positions the beam at a target position to avoid irradiation of normal tissue includes an acceleration system 6 for extracting a charged particle beam, scanning magnets 24 and 25, and charged particle beam position monitors 26 and 27. On the basis of signals received from the charged particle beam position monitors 26 and 27, the control unit 70 calculates a beam position at a target position and then controls the scanning magnets 24 and 25 so that the charged particle beam is moved to a desired irradiation position at the target position. The control unit 70 corrects the value of an excitation current applied to each of the scanning magnets 24 and 25 on a specified cycle basis on the basis of information about the position and the angle of the charged particle beam.

Claims

1. A charged particle irradiation system comprising:

an accelerator for extracting a charged particle beam;

charged-particle-beam scanning equipment; and

a charged-particle-beam-position monitor system, wherein said charged particle irradiation system further includes a control unit for calculating a beam position at a target position on the basis of a signal received from the charged-particle-beam-position monitor system to control the charged-particle-beam scanning equipment so that the charged particle beam is moved to a desired irradiation position at the target position.

2. The charged particle irradiation system according to claim 1, wherein:

said control unit corrects the value of an excitation current applied to the charged-particle-beam scanning equipment on a specified cycle basis on the basis of information about the position and the angle of the charged particle beam.

3. The charged particle irradiation system according to claim 1, wherein:

in each extraction cycle of the accelerator, said control unit corrects the value of an excitation current applied to the charged-particle-beam scanning equipment on the basis of information about the position and the angle of the charged particle beam.

4. The charged particle irradiation system according to claim 1, wherein:

said control unit sets an excitation current value for the charged-particle-beam scanning equipment such that in the next cycle, a point on the opposite side of the charged particle beam position with respect to the desired irradiation position, which point is away from the beam position by the distance between the beam position and the desired position at the target position, is irradiated with such a charged particle beam with which the beam position agrees with the desired irradiation position.

5. The charged particle irradiation system according to claim 3, wherein:

even when the charged-particle-beam scanning equipment scans the charged particle beam, said control unit calculates the distance between the desired position and the charged particle beam position at the target position on the basis of the distance between the position of the charged particle beam traveling toward the desired irradiation position at the position of the charged-particle-beam-position monitor system and the path of the charged particle beam.

6. The charged particle irradiation system according to claim 1, wherein:

said control unit identifies the progress of the phase of the extraction cycle from a radiated charge amount in the same extraction cycle.

7. The charged particle irradiation system according to claim 1, wherein:

said control unit identifies the progress of the phase of the extraction cycle from a numerical value that is obtained by dividing a radiated charge amount in the same extraction cycle by an accumulated charge amount.

8. The charged particle irradiation system according to claim 1, wherein:

said control unit corrects the charged particle beam irradiation position in the next extraction cycle by a function in which a position to which the charged particle beam irradiation position changes according to the phase in the extraction cycle is approximated by a phase function of the extraction cycle.

9. The charged particle irradiation system according to claim 1, wherein:

said charged particle irradiation system is equipped with two of the charged-particle-beam-position monitor systems, with one disposed upstream of the charged-particle-beam scanning equipment and the other disposed downstream of the charged-particle-beam scanning equipment.

10. The charged particle irradiation system according to claim 1, wherein:

said charged particle irradiation system is equipped with two of the charged-particle-beam-position monitor systems, with both of them disposed downstream of the charged-particle-beam scanning equipment.

11. The charged particle irradiation system according to claim 1, wherein:

said charged particle irradiation system is equipped with one charged-particle-beam-position monitor system, said monitor system being capable of measuring both the position and the angle of the charged particle beam.

12. The charged particle irradiation system according to claim 1, wherein:

if the difference between the charged particle beam position and the desired irradiation position at the target position exceeds a threshold value, a safety interlock system is operated, said charged particle beam position having been calculated by the control unit.

13. The charged particle irradiation system according to claim 1, wherein:

said charged particle irradiation system is equipped with two of the charged-particle-beam-position monitor systems, with both of them disposed upstream of the charged-particle-beam scanning equipment.