LATTICE-MISMATCHED SEMICONDUCTOR STRUCTURES WITH REDUCED DISLOCATION DEFECT DENSITIES AND RELATED METHODS FOR DEVICE FABRICATION
First Claim
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1. A method of forming a structure, the method comprising:
- providing a dielectric sidewall, proximate a substrate, with a height h, the substrate comprising a first crystalline semiconductor material and a top surface having a first crystal orientation, the dielectric sidewall defining an opening with a width w exposing a portion of the substrate;
defining, in the exposed portion of the substrate, a recess with a maximum depth d and a recessed surface comprising a second crystal orientation; and
forming, in the recess, a second crystalline semiconductor material having a lattice mismatch with the first crystalline semiconductor material, the lattice mismatch creating defects in the second crystalline semiconductor material, the defects terminating at a distance H above a deepest point of the recess.
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Abstract
A method of forming a semiconductor structure includes forming an opening in a dielectric layer, forming a recess in an exposed part of a substrate, and forming a lattice-mismatched crystalline semiconductor material in the recess and opening.
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Citations
40 Claims
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1. A method of forming a structure, the method comprising:
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providing a dielectric sidewall, proximate a substrate, with a height h, the substrate comprising a first crystalline semiconductor material and a top surface having a first crystal orientation, the dielectric sidewall defining an opening with a width w exposing a portion of the substrate; defining, in the exposed portion of the substrate, a recess with a maximum depth d and a recessed surface comprising a second crystal orientation; and forming, in the recess, a second crystalline semiconductor material having a lattice mismatch with the first crystalline semiconductor material, the lattice mismatch creating defects in the second crystalline semiconductor material, the defects terminating at a distance H above a deepest point of the recess. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18)
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19. A semiconductor structure comprising:
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a substrate comprising a first crystalline semiconductor material having a top surface with a first crystal orientation, the substrate including a recess therein with a maximum depth d, the recess comprising a recessed surface with a second crystal orientation; a dielectric sidewall of height h disposed proximate the recess; and a second crystalline semiconductor material of maximum width w disposed in the recess, the recess defining an interface between the second crystalline semiconductor material and the substrate, wherein the second crystalline semiconductor material has a lattice mismatch with the first crystalline semiconductor material, the lattice mismatch creates defects in the second crystalline semiconductor material, and the defects terminate at a distance H above a bottom surface of the recess. - View Dependent Claims (20, 21, 22, 23, 24, 25, 26, 27, 28, 29, 30, 31, 32, 33, 34, 35)
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36. A semiconductor structure comprising:
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a photonic structure; and a crystalline semiconductor disposed above the photonic structure, wherein a surface of the crystalline semiconductor comprises a plurality of ridges, a width of one ridge in the plurality of ridges is less than or equal to a visible light wavelength, and a spacing of the plurality of ridges is less than or equal to the visible light wavelength. - View Dependent Claims (37, 38, 39)
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40. A method of forming a structure, the method comprising:
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defining a recess with a maximum depth d in a top surface of a (100) substrate comprising a first crystalline semiconductor material, the recess exposing a (111) surface of the substrate; and forming a III-nitride material in the recess, wherein the III-nitride has a lattice mismatch with the first crystalline semiconductor material and the lattice mismatch creates defects in the III-nitride material perpendicular to the (111) surface, resulting in a substantially defect-free region in the III-nitride material.
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Specification