Method of Acceptance for Semiconductor Devices
First Claim
1. A method of accepting semiconductor chips using on-chip parametric measurements, the method comprising:
- determining an on-chip parametric measurement structure for each parameter in a set of parametric acceptance criteria;
including an on-chip parametric measurement macro in a design of each semiconductor chip for each identified on-chip parametric measurement structure;
testing each on-chip parametric measurement macro to determine compliance of the semiconductor chip to the set of parametric acceptance criteria; and
validating the compliance to the set of parametric acceptance criteria.
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Abstract
A method of accepting semiconductor chips is provided using on-chip parametric measurements. An on-chip parametric measurement structure is determined for each parameter in a set of parametric acceptance criteria. An on-chip parametric measurement macro is included in a design of each semiconductor chip for each identified on-chip parametric measurement structure. Each on-chip parametric measurement macro is tested to determine compliance of the semiconductor chip to the set of parametric acceptance criteria. Compliance to the set of parametric acceptance criteria is validated.
18 Citations
7 Claims
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1. A method of accepting semiconductor chips using on-chip parametric measurements, the method comprising:
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determining an on-chip parametric measurement structure for each parameter in a set of parametric acceptance criteria; including an on-chip parametric measurement macro in a design of each semiconductor chip for each identified on-chip parametric measurement structure; testing each on-chip parametric measurement macro to determine compliance of the semiconductor chip to the set of parametric acceptance criteria; and validating the compliance to the set of parametric acceptance criteria. - View Dependent Claims (2, 3, 4, 5, 6, 7)
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Specification