METHOD AND APPARATUS FOR MONITORING AND ENHANCING ON-CHIP MICROPROCESSOR RELIABILITY
First Claim
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1. A system for projecting reliability to manage system functions, comprising:
- an activity module which determines activity in the system;
a reliability module interacting with the activity module to determine a reliability measurement for the module in real-time based upon the activity and measured operational quantities of the system; and
a management module which manages actions of the system based upon the reliability measurement input from the reliability module.
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Abstract
A system and method for projecting reliability to manage system functions includes an activity module which determines activity in the system. A reliability module interacts with the activity module to determine a reliability measurement for the module in real-time based upon the activity and measured operational quantities of the system. A management module manages actions of the system based upon the reliability measurement input from the reliability module. This may be to provide corrective action, to reallocate resources, increase reliability of the module, etc.
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Citations
19 Claims
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1. A system for projecting reliability to manage system functions, comprising:
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an activity module which determines activity in the system; a reliability module interacting with the activity module to determine a reliability measurement for the module in real-time based upon the activity and measured operational quantities of the system; and a management module which manages actions of the system based upon the reliability measurement input from the reliability module. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 18, 19)
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14. An integrated circuit having a reliability management system integrated therein, comprising:
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an activity module which determines activity of the integrated circuit; a reliability module interacting with the activity module to determine a reliability measurement for the module in real-time based upon the activity and measured operational quantities of the integrated circuit; and a management module which manages actions of the integrated circuit based upon the reliability measurement input from the reliability module. - View Dependent Claims (15, 16, 17)
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Specification