Microscopic Cell Observation and Inspection System Using a Plurality of Observation Methods

• US 20090052021A1
• Filed: 09/13/2006
• Published: 02/26/2009
• Est. Priority Date: 09/26/2005
• Status: Active Grant

• Current Assignee: Hamamatsu University School of Medichine, KEIO University
• Original Assignee: Hamamatsu University School of Medichine, KEIO University
• Inventors: Kazoe, Yutaka, Mogami, Hideo, Sato, Yohei
• Granted Patent: US 7,706,060 B2
• Time in Patent Office: Days
• US Class Current: 359/385
• CPC Class Codes: G01N 21/6458 Fluorescence microscopy fluorescence microscopes per se G02B21/0076 and G02B21/16
• CPC Class Codes: G01N 21/648 using evanescent coupling or surface plasmon coupling for the excitation of fluorescence
• CPC Class Codes: G01N 2201/06113 Coherent sources; lasers
• CPC Class Codes: G02B 21/0044 moving apertures, e.g. Nipkow disks, rotating lens arrays
• CPC Class Codes: G02B 21/06 Means for illuminating specimens

Abstract

The invention relates to a microscopic cell observation and inspection system that uses a total internal reflection cell illuminator that is capable of freely changing an observation position without recourse to any special slide glass, makes sure high SN-ratio observation and facilitates sample manipulation, thereby making high-sensitivity, fast detection of a lot of cell reactions on the same slide glass. While, in response to a command from personal computer (80), step motors (53, 54) are driven to sequentially scan observation positions of cell sample (S) on slide glass (21), one of shutter units (71) and (72) is closed and the other is opened at high speed, whereby either one of illumination optical paths for a TIRF microscope and a drop fluorescence microscope is selected to illuminate cell sample (S) on that observation position. When the drop fluorescence microscope is chosen, filter unit (66) is driven to choose the wavelength of excitation light from drop fluorescence illumination light source (65), so that observation and inspection of cell sample (S) under the TIRF microscope and drop fluorescence microscope can be implemented in an alternate fast switchover way.

Claims

1. A microscopic observation and inspection system using a plurality of observation methods, characterized by comprising a total internal reflection sample illuminator comprising an evanescent wave-generation light source in which laser light from that light source is introduced into a slide glass through which the laser light is guided by multiple total internal reflections to generate evanescent waves on an upper surface of said slide glass so that a cell sample placed on the upper surface of said slide glass is illuminated with said evanescent waves, wherein:

a microscope objective lens is located at a position where said slide glass in said total internal reflection sample illuminator is supposed to be placed thereon and in a vertical direction to said slide glass,

on an imaging side of said microscope objective lens, an imaging optical system and an imaging device are located in one optical path via an optical path splitter and an excitation light source for a drop fluorescence microscope is located in another optical path,

shutter units adapted to block off or transmit illumination light are located, one in an optical path from said evanescent wave-generation light source to a laser light inlet of said slide glass, and another between said excitation light source for a drop fluorescence microscope and said optical path splitter,

there is a controller provided which controls an illumination light source switchover by opening or closing each of said shutter units and slide glass position adjustment by said slide glass position adjustment mechanism, and

in response to a command from said controller, the opening or closing of each of said shutter units is controlled so that an illumination light optical path for said evanescent wave-generation light source and an illumination light optical path for said excitation light source for a drop fluorescence microscope are selectively opened, a total internal reflection fluorescence microscope image and a drop fluorescence microscope image at the selected cell sample observation and inspection site on said slide glass are captured in said controller via said imaging device, and cell reactions are detected from said total internal reflection fluorescence microscope image and said drop fluorescence microscope image.

2. The microscopic observation and inspection system using a plurality of observation methods according to claim 1, characterized in that:

said total internal reflection sample illuminator comprises an entrance prism and a radiation prism which support said slide glass movably in a plane thereof via a droplet of index-matching liquid,

said entrance prism is fixed with respect to said light source, and said radiation prism is located in such a way as to be adjustable in terms of position in a direction of travel of said laser light with respect to said entrance prism,

a supporting surface of said entrance prism for said slide glass is flush with a supporting surface of said radiation prism for said slide glass irrespective of a position of the said radiation prism being adjusted,

there is a slide glass position adjustment mechanism provided which takes a grip on said slide glass supported on said entrance prism and said radiation prism to adjust a position of said slide glass in a two-dimensional direction along a plane thereof,

said total internal reflection sample illuminator is set up such that said laser light leaves said supporting surface via said entrance prism and enters said slide glass supported thereon via said index-matching liquid trickling down thereon through which said laser light is guided by multiple total internal reflection, entering from said supporting surface of said radiation prism into said radiation prism via said index-matching liquid trickling down on said supporting surface of said radiation prism, and is radiated out from said radiation prism, and

in response to a command from said controller, said slide glass position adjustment mechanism is controlled to select an observation and inspection position for the cell sample on said slide glass.

3. The microscopic observation and inspection system using a plurality of observation methods according to claim 2, characterized in that said optical path splitter comprises a dichroic mirror and is operable to prevent light having a wavelength of illumination light from said evanescent wave-generation light source and light having a wavelength of illumination light from said excitation light source for a drop fluorescence microscope from arriving at said optical path on the imaging device side but allow only fluorescence emanating from the cell sample to arrive at said optical path on the imaging device side.

4. The microscopic observation and inspection system using a plurality of observation methods according to claim 3, characterized in that between said excitation light source for a drop fluorescence microscope and said optical path splitter there is a filter unit located which selects an excitation wavelength, and in response to a command from said controller an excitation wavelength transmitting through said filter unit is selected.

7. The microscopic observation and inspection system using a plurality of observation methods according to claim 1, characterized in that said optical path splitter comprises a dichroic mirror and is operable to prevent light having a wavelength of illumination light from said evanescent wave-generation light source and light having a wavelength of illumination light from said excitation light source for a drop fluorescence microscope from arriving at said optical path on the imaging device side but allow only fluorescence emanating from the cell sample to arrive at said optical path on the imaging device side.

8. The microscopic observation and inspection system using a plurality of observation methods according to claim 7, characterized in that between said excitation light source for a drop fluorescence microscope and said optical path splitter there is a filter unit located which selects an excitation wavelength, and in response to a command from said controller an excitation wavelength transmitting through said filter unit is selected.

9. The microscopic observation and inspection system using a plurality of observation methods according to claim 1, characterized in that between said excitation light source for a drop fluorescence microscope and said optical path splitter there is a filter unit located which selects an excitation wavelength, and in response to a command from said controller an excitation wavelength transmitting through said filter unit is selected.

10. The microscopic observation and inspection system using a plurality of observation methods according to claim 2, characterized in that between said excitation light source for a drop fluorescence microscope and said optical path splitter there is a filter unit located which selects an excitation wavelength, and in response to a command from said controller an excitation wavelength transmitting through said filter unit is selected.

5. A microscopic observation and inspection system using a plurality of observation methods, characterized by comprising a total internal reflection sample illuminator comprising an evanescent wave-generation light source in which laser light from that light source is introduced into a slide glass through which the laser light is guided by multiple total internal reflections to generate evanescent waves on an upper surface of said slide glass so that a cell sample placed on the upper surface of said slide glass is illuminated with said evanescent waves, wherein:

a microscope objective lens is located at a position where said slide glass in said total internal reflection sample illuminator is supposed to be placed thereon and in a vertical direction to said slide glass,

on an imaging side of said microscope objective lens, a filter for blocking off light having a wavelength of illumination light from said evanescent wave-generation light source, a first imaging optical system and a first imaging device are located in one optical path via an optical path splitter, and a confocal scanner for a confocal fluorescence microscope is located in another optical path,

on an illumination side of said confocal scanner an excitation light source for the confocal fluorescence microscope is located, and on an output side of said confocal scanner a second imaging system and a second imaging device are located,

shutter units adapted to block off or transmit illumination light or fluorescent light are located, one in an optical path from said evanescent wave-generation light source to a laser light inlet of said slide glass, another in an optical path between said confocal scanner and said optical path splitter, and yet another in an optical path between said optical path splitter and said first imaging device,

there is a controller provided which controls an illumination light source switchover by opening or closing each of said shutter units, and a focus adjustment mechanism adapted to adjust a position of said microscope objective lens in an optical axis direction, and

in response to a command from said controller, the opening or closing of each of said shutter units is controlled so that an illumination light optical path for said evanescent wave-generation light source and an illumination light optical path for a confocal scanner for said drop fluorescence microscope are selectively opened, and when the illumination optical path for the confocal scanner for said confocal fluorescence microscope is opened, said focus adjustment mechanism is controlled to adjust a position of said microscope objective lens in an optical axis direction to a plurality of given positions, whereby a total internal reflection fluorescence microscope image and a confocal fluorescence microscope image at the selected cell sample observation and inspection position on said slide glass are captured in said controller vial said first imaging device and said second imaging device, respectively, so that cell reactions are detected from said total internal reflection fluorescence microscope image and said confocal fluorescence microscope image.

6. The microscopic observation and inspection system using a plurality of observation methods according to claim 5, characterized in that:

said total internal reflection sample illuminator comprises an entrance prism and a radiation prism which support said slide glass movably in a plane thereof via a droplet of index-matching liquid,

said entrance prism is fixed with respect to said light source, and said radiation prism is located in such a way as to be adjustable in terms of position in a direction of travel of said laser light with respect to said entrance prism,

a supporting surface of said entrance prism for said slide glass is flush with a supporting surface of said radiation prism for said slide glass irrespective of a position of the said radiation prism being adjusted,

there is a slide glass position adjustment mechanism provided which takes a grip on said slide glass supported on said entrance prism and said radiation prism to adjust a position of said slide glass in a two-dimensional direction along a plane thereof,

said total internal reflection sample illuminator is set up such that said laser light leaves said supporting surface via said entrance prism and enters said slide glass supported thereon via said index-matching liquid trickling down thereon through which said laser light is guided by multiple total internal reflection, entering from said supporting surface of said radiation prism into said radiation prism via said index-matching liquid trickling down on said supporting surface of said radiation prism, and is radiated from said radiation prism toward outside, and

in response to a command from said controller, said slide glass position adjustment mechanism is controlled to select an observation and inspection position for the cell sample on said slide glass.