PMU TESTING VIA A PE STAGE
First Claim
Patent Images
1. An apparatus for use in testing a device, comprising:
- a parametric measurement unit to measure a first signal from the device; and
pin electronics to provide a second signal to the device, the pin electronics comprising circuitry along a path to the device;
wherein the parametric measurement unit is configured to send a third signal to the pin electronics, the third signal being used to generate the second signal;
wherein the parametric measurement unit is electrically connected to the device via the circuitry to receive the first signal via the circuitry.
3 Assignments
0 Petitions
Accused Products
Abstract
An apparatus for use in testing a device includes a parametric measurement unit to measure a first signal from the device, and pin electronics to provide a second signal to the device. The pin electronics includes circuitry along a path to the device. The parametric measurement unit is electrically connected to the device via the circuitry to receive the first signal via the circuitry.
-
Citations
22 Claims
-
1. An apparatus for use in testing a device, comprising:
-
a parametric measurement unit to measure a first signal from the device; and pin electronics to provide a second signal to the device, the pin electronics comprising circuitry along a path to the device; wherein the parametric measurement unit is configured to send a third signal to the pin electronics, the third signal being used to generate the second signal; wherein the parametric measurement unit is electrically connected to the device via the circuitry to receive the first signal via the circuitry. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9)
-
-
10. A system for testing an electronic device, comprising:
-
a device interface board to hold the electronic device; a testing device to send test signals to the electronic device and to receive response signals from the electronic device, the response signals resulting from at least some of the test signals; and a processing device to provide control signals to the testing device, the control signals to affect operation of the testing device; wherein the testing device comprises; a pin electronics circuit to provide test signals to the device, the pin electronics circuit comprising at least two transistors; and a parametric measurement unit to test the electronic device via the pin electronics circuit and to send a DC signal to the pin electronics circuit; wherein the at least two transistors are configured to generate an AC signal from the DC signal. - View Dependent Claims (11, 12, 13, 14, 15, 16)
-
-
17. A testing apparatus comprising:
-
a first circuit for providing AC test signals to a device, the first circuit comprising at least two transistors; a second circuit for providing DC test signals to the device and for providing a voltage signal to the first circuit; and circuitry for electrically connecting the first circuit to the second circuit; wherein the second circuit is configured to measure electrical characteristics of the device via the circuitry and the first circuit; and wherein the at least two transistors are configured to generate the AC test signal from the voltage signal. - View Dependent Claims (18, 19, 20, 21, 22)
-
Specification