SYSTEMS AND METHODS FOR CREATING PERSISTENT DATA FOR A WAFER AND FOR USING PERSISTENT DATA FOR INSPECTION-RELATED FUNCTIONS
First Claim
1. A system configured to store image data generated by scanning a wafer with an inspection system, comprising:
- a set of processor nodes coupled to a detector of an inspection system, wherein each of the processor nodes is configured to receive a portion of image data generated by the detector during scanning of a wafer; and
an array of storage media separately coupled to each of the processor nodes, wherein the processor nodes are further configured to send all of the image data or a selected portion of the image data received by the processor nodes to the arrays of storage media such that all of the image data or the selected portion of the image data generated by the detector during the scanning of the wafer is stored in the arrays of the storage media.
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Abstract
Various systems and methods for creating persistent data for a wafer and using persistent data for inspection-related functions are provided. One system includes a set of processor nodes coupled to a detector of an inspection system. Each of the processor nodes is configured to receive a portion of image data generated by the detector during scanning of a wafer. The system also includes an array of storage media separately coupled to each of the processor nodes. The processor nodes are configured to send all of the image data or a selected portion of the image data received by the processor nodes to the arrays of storage media such that all of the image data or the selected portion of the image data generated by the detector during the scanning of the wafer is stored in the arrays of the storage media.
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Citations
62 Claims
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1. A system configured to store image data generated by scanning a wafer with an inspection system, comprising:
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a set of processor nodes coupled to a detector of an inspection system, wherein each of the processor nodes is configured to receive a portion of image data generated by the detector during scanning of a wafer; and an array of storage media separately coupled to each of the processor nodes, wherein the processor nodes are further configured to send all of the image data or a selected portion of the image data received by the processor nodes to the arrays of storage media such that all of the image data or the selected portion of the image data generated by the detector during the scanning of the wafer is stored in the arrays of the storage media. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20, 21, 22, 23, 24, 25, 26, 27, 28, 29, 30, 31, 32, 33, 34, 35, 36, 37, 38, 39, 40, 41, 42, 43, 44, 45, 46, 47, 48, 49, 50, 51, 52, 53, 54, 55, 56, 57, 58, 59, 60)
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61. An inspection system configured to detect defects on a wafer, comprising:
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an inspection subsystem configured to generate image data for a wafer by scanning the wafer; a set of processor nodes coupled to the inspection subsystem, wherein each of the processor nodes is configured to receive a portion of the image data generated by the inspection subsystem during the scanning of the wafer, and wherein each of the processor nodes is further configured to detect defects on the wafer using the portion of the image data received by each of the processor nodes; and an array of storage media separately coupled to each of the processor nodes, wherein the processor nodes are further configured to send all of the image data or a selected portion of the image data received by the processor nodes to the arrays of storage media such that all of the image data or the selected portion of the image data generated by the inspection subsystem during the scanning of the wafer is stored in the arrays of the storage media.
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62. A method for storing image data generated by scanning a wafer with an inspection system, comprising:
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separately receiving different portions of image data generated by a detector of an inspection system during scanning of a wafer; and separately sending the different portions or selected portions of the different portions to different arrays of storage media such that all of the image data or a selected portion of the image data generated by the detector during the scanning of the wafer is stored in the different arrays of the storage media.
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Specification