METHOD FOR MONITORING AND ADJUSTING CIRCUIT PERFORMANCE
First Claim
1. A method for testing an integrated circuit implemented in an electronic system, the method comprising:
- placing one or more functional blocks of an integrated circuit into an offline status;
setting an electrical parameter of the one or more functional blocks of the integrated circuit to a first of a plurality of predetermined values;
conducting a built-in self-test (BIST) of the one or more functional blocks of the integrated circuit;
recording any failures that occur while performing the BIST;
repeating said setting, said conducting, and said recording for each of remaining one of the plurality of predetermined values of the electrical parameter; and
determining a failure rate and a passing range for the BIST for each of the predetermined values.
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Accused Products
Abstract
A method for testing an integrated circuit implemented in an electronic system. The method includes placing an integrated circuit (or portion thereof) that is implemented in an operational system (e.g., in a computer system) in an offline status. An electrical parameter of the integrated system (e.g., a voltage, clock frequency, etc.) is set, and a built-in self-test (BIST) is conducted. Any failures that occur during the BIST are recorded. Testing is then repeated for each of a plurality of predetermined values of the electrical parameter, recording any failures that occur. Once testing is complete a failure rate/range is determined for each of the predetermined values.
16 Citations
20 Claims
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1. A method for testing an integrated circuit implemented in an electronic system, the method comprising:
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placing one or more functional blocks of an integrated circuit into an offline status; setting an electrical parameter of the one or more functional blocks of the integrated circuit to a first of a plurality of predetermined values; conducting a built-in self-test (BIST) of the one or more functional blocks of the integrated circuit; recording any failures that occur while performing the BIST; repeating said setting, said conducting, and said recording for each of remaining one of the plurality of predetermined values of the electrical parameter; and determining a failure rate and a passing range for the BIST for each of the predetermined values. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10)
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11. A method for testing an integrated circuit implemented in an electronic system, the method comprising:
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placing one or more functional blocks of the integrated circuit into an offline status, wherein the one or more functional blocks of integrated circuit includes one or more PMOS (p-channel metal oxide semiconductor) devices; setting an n-well voltage for the one or more PMOS devices to a first of a plurality of predetermined values; conducting a built-in self-test (BIST) on the one or more functional blocks of the integrated circuit; recording any failures that occur while performing the BIST; repeating said setting, said conducting, and said recording for each remaining one of the plurality predetermined values of the n-well voltage; and determining a failure rate and a passing range for the BIST for each of the plurality of predetermined values - View Dependent Claims (12, 13, 14, 15)
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16. A method for testing an integrated circuit implemented in an electronic system, the method comprising:
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placing one or more functional blocks of the integrated circuit into an offline status, wherein the one or more functional blocks of the integrated circuit includes one or more NMOS (n-channel metal oxide semiconductor) devices; setting substrate voltage for the one or more NMOS devices to a first of a plurality of predetermined values; conducting a built-in self-test (BIST) on the one or more functional blocks of the integrated circuit; recording any failures that occur while performing the BIST; repeating said setting, said conducting, and said recording for each remaining one of the plurality predetermined values of the substrate voltage; and determining a failure rate and a passing range for the BIST for each of the plurality of predetermined values. - View Dependent Claims (17, 18, 19, 20)
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Specification