×

METHOD FOR MONITORING AND ADJUSTING CIRCUIT PERFORMANCE

  • US 20090083598A1
  • Filed: 09/26/2007
  • Published: 03/26/2009
  • Est. Priority Date: 09/26/2007
  • Status: Active Grant
First Claim
Patent Images

1. A method for testing an integrated circuit implemented in an electronic system, the method comprising:

  • placing one or more functional blocks of an integrated circuit into an offline status;

    setting an electrical parameter of the one or more functional blocks of the integrated circuit to a first of a plurality of predetermined values;

    conducting a built-in self-test (BIST) of the one or more functional blocks of the integrated circuit;

    recording any failures that occur while performing the BIST;

    repeating said setting, said conducting, and said recording for each of remaining one of the plurality of predetermined values of the electrical parameter; and

    determining a failure rate and a passing range for the BIST for each of the predetermined values.

View all claims
  • 2 Assignments
Timeline View
Assignment View
    ×
    ×