SYSTEM FOR AND METHOD OF INTEGRATING TEST STRUCTURES INTO AN INTEGRATED CIRCUIT
First Claim
1. A method comprising:
- identifying at least one device under test (DUT) which matches at least one device in an integrated circuit (IC) design;
generating a first test structure comprising a control structure coupled to the at least one DUT; and
modifying the IC design to include the first test structure.
3 Assignments
0 Petitions
Accused Products
Abstract
A system and method for performing device-specific testing and acquiring parametric data on integrated circuits, for example ASICs, such that each chip is tested individually without excessive test time requirements, additional silicon, or special test equipment. The testing system includes a device test structure integrated into an IC design which tests a set of dummy devices that are identical or nearly identical to a selected set of devices contained in the IC. The test structures are built from a device under test (DUT) library according to customer requirements and design requirements. The selected test structures are further prioritized and assigned to design elements within the design in order of priority. Placement algorithms use design, layout, and manufacturing requirements to place the selected test structures into the final layout of the design to be manufactured.
-
Citations
24 Claims
-
1. A method comprising:
-
identifying at least one device under test (DUT) which matches at least one device in an integrated circuit (IC) design; generating a first test structure comprising a control structure coupled to the at least one DUT; and modifying the IC design to include the first test structure. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8)
-
-
9. A system comprising:
-
an IC design comprising at least one device and at least one element; a library comprising at least one device under test (DUT), wherein the at least one DUT matches the at least one device; and a modified IC design comprising at least one control structure, the control structure coupled to the at least one DUT and the at least one element. - View Dependent Claims (10, 11, 12, 13, 14, 15)
-
-
16. A computer readable program product embodied in a computer readable medium, the program product causing a computer to:
-
identify a first device under test (DUT) the first DUT matching at least one device in an integrated circuit (IC) design; and modify the IC design to include the first DUT coupled to a control structure and at least one element in the IC design. - View Dependent Claims (17, 18, 19, 20, 21, 22, 23, 24)
-
Specification