Method And Apparatus For Testing Devices Using Serially Controlled Intelligent Switches
First Claim
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1. A probe card assembly, comprising:
- a plurality of integrated circuits (ICs) serially coupled to form a chain, the chain coupled to at least one serial control line, the plurality of ICs including switches coupled to test probes, each of the switches being programmable responsive to a control signal on the at least one serial control line.
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Abstract
Methods and apparatus for testing devices using serially controlled intelligent switches have been described. In some embodiments, a probe card assembly can be provided that includes a plurality of integrated circuits (ICs) serially coupled to form a chain, the chain coupled to at least one serial control line, the plurality of ICs including switches coupled to test probes, each of the switches being programmable responsive to a control signal on the at least one serial control line.
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Citations
21 Claims
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1. A probe card assembly, comprising:
a plurality of integrated circuits (ICs) serially coupled to form a chain, the chain coupled to at least one serial control line, the plurality of ICs including switches coupled to test probes, each of the switches being programmable responsive to a control signal on the at least one serial control line. - View Dependent Claims (2, 3, 4, 5, 6, 7)
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8. A test assembly, comprising:
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a printed wiring board including connectors for connecting to test instruments, and a serial control line providing a control signal; a probe head supporting test probes; and at least one integrated circuit (IC) coupled to the serial control line, the at least one IC including switches coupled to at least a portion of the test probes, each of the switches being programmable responsive to the control signal transmitted as a sequential bit stream on the serial control line. - View Dependent Claims (9, 10, 11, 12, 13, 14)
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15. A method of testing components on a wafer using a probe card assembly, comprising:
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serially shifting a control signal through a chain comprising a plurality of integrated circuits (ICs) including a plurality of switches, the plurality of switches being programmed responsive to the control signal; and communicating test signals between test probes and test instruments through the plurality of switches to test the components. - View Dependent Claims (16, 17, 18, 19, 20)
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21. -37. (canceled)
Specification