METHODS AND SYSTEMS FOR ANALYZING SOLIDS

• US 20090091740A1
• Filed: 04/14/2005
• Published: 04/09/2009
• Est. Priority Date: 04/15/2004
• Status: Abandoned Application

• Current Assignee: TransForm Pharmaceuticals, Inc. (Johnson & Johnson)
• Original Assignee: TransForm Pharmaceuticals, Inc. (Johnson & Johnson)
• Inventors: Kane, Nathan, Oliveira, Mark, MacPhee, Michael
• Application Number:
  US10/599,804
• Publication Number:
  US 20090091740A1
• Time in Patent Office: Days
• US Class Current: 356/36
• CPC Class Codes: B01L 2300/0838 Capillaries
• CPC Class Codes: B01L 9/06 Test-tube stands; Test-tube holders
• CPC Class Codes: G01N 1/08 involving an extracting tool, e.g. core bit
• CPC Class Codes: G01N 2001/2873 Cutting or cleaving
• CPC Class Codes: G01N 21/65 Raman scattering
• CPC Class Codes: G01N 23/2005 Preparation of powder samples therefor

Abstract

Methods and systems for the analysis of solid materials are disclosed. The present invention comprises x-ray and Raman analytical techniques and systems which facilitate the rapid characterization of a plurality of solid samples.

Claims

1-26. -26. (canceled)

27. A method for analysis of a solid material, comprising:

(a) coring the solid material with a coring tool such that a plug is formed;

(b) extruding the plug of solid material

(c) exposing the plug of solid material to radiation; and

(d) detecting scattered radiation.

28. The method for analysis of a solid material of claim 27, further comprising compressing said solid material after said plug is formed.

32. The method for analysis of a solid material of claim 27, wherein a pin is used to extrude said plug of solid material.

33. The method for analysis of a solid material of claim 32, wherein a micrometer is used to adjust the position of said pin.

35. The method for analysis of a solid material of claim 27, wherein said radiation is x-ray radiation.

36. The method for analysis of a solid material of claim 27, wherein said radiation is infrared radiation.

37. The method for analysis of a solid material of claim 35, wherein said x-ray radiation is emitted with an angle of incidence less than or equal to 2.50 degrees.

38. A method for the analysis of a plurality of solid samples, comprising:

(a) coring each solid sample with a coring tool such that each solid sample forms a plug;

(b) extruding each plug of solid material;

(c) exposing each plug of solid material to radiation; and

(d) detecting scattered radiation.

39. A system for analyzing a solid material, comprising:

(a) a coring tool comprising a means for extruding a plug of solid material;

(b) a means for exposing the plug of solid material to radiation; and

(c) a means for detecting scattered radiation.

40. The system for analyzing a solid material of claim 39, further comprising a means for compressing said solid material.

41. The system for analyzing a solid material of claim 39, further comprising a rack, wherein said rack comprises a top plate with one or more holes.

42. The system for analyzing a solid material of claim 41, wherein said top plate is composed of a material that absorbs x-ray radiation.

43. The system for analyzing a solid material of claim 39, wherein a plurality of solid materials is analyzed.