3-Dimensional Shape Measuring Method and Device Thereof
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Abstract
It is possible to measure a 3-dimensional shape by using a projector and an imaging device without requiring calibration in advance. A pattern light is applied from a projector to an object and this is imaged by an imaging device to capture an image as an input. An in-camera parameter, an in-projector parameter, a parameter of positional relationship between the camera and the projector are estimated. By using the estimation results, a 3-dimensional shape of the object is measured. When a laser pointer is attached to the projector and a laser is applied to the object for capturing an image as an input, scaling of the object shape can also be estimated. Moreover, when measuring a plurality of objects or measuring the same objects a plurality of times, the accuracy of the 3-dimensional shape respectively obtained can be increased by simultaneously processing the inputs. Moreover, when one of projector and the camera is fixed and the other is moved while measuring the same object a plurality of times, the accuracy of the 3-dimensional shape obtained as a result can be increased by performing bundle adjustment.
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Citations
40 Claims
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1-20. -20. (canceled)
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21. A measuring method using a pattern projector and an image capturing device having a fixed relative positional relationship to each other, said measuring method comprising:
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emitting a pattern light to a target object by said pattern projector; obtaining one or more images by capturing the pattern light by said image capturing device as an input; estimating an internal parameter of said pattern projector, an internal parameter of said image capturing device, and a relative positional relationship between said pattern projector and said image capturing device from the pattern of the captured image by using an epipolar constraint of said pattern projector and said image capturing device; estimating 3D coordinates representing the surface of said target object by a principle of triangulation using the captured pattern light and the estimated internal parameters of said pattern projector and said image capturing device, and the estimated relative positional relationship therebetween; and measuring a 3D shape based on the estimated 3D coordinates representing the surface of said target object and the estimated internal parameters of said pattern projector and said image capturing device and the estimated relative positional relationship therebetween, wherein the 3D coordinate of the surface of said target object is estimated without providing a specific assumption as to said pattern projector and said image capturing device and without previously measuring the internal parameters of said pattern projector and said image capturing device and the relative positional relationship therebetween. - View Dependent Claims (22, 23, 24)
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25. A measuring apparatus comprising:
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a pattern projector that emits pattern light to a target object; an image capturing device that captures the pattern light, the pattern projector and the image capturing device having a fixed relative positional relationship to each other and capturing one or more images based on the captured pattern light; and a 3D coordinate estimating section that estimates 3D coordinates representing the surface of said target object from the captured image by estimating an internal parameter of said pattern projector, an internal parameter of said image capturing device, and a relative positional relationship between said pattern projector and said image capturing device from the pattern of the captured pattern light by using an epipolar constraint of said pattern projector and said image capturing device, and by estimating 3D coordinates representing the surface of said target object by a principle of triangulation using the captured pattern light and the estimated internal parameters of said pattern projector and said image capturing device and the estimated relative positional relationship therebetween, wherein the 3D coordinate representing the surface of said target object are estimated without providing a specific assumption as to said pattern projector and said image capturing device and without previously measuring the internal parameters of said pattern projector and said image capturing device and the relative positional relationship therebetween. - View Dependent Claims (26, 27, 28)
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29. A measuring method using a pattern projector and an image capturing device having a fixed relative positional relationship, the measuring method comprising:
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emitting a pattern light to a target object by said pattern projector; obtaining one or more images by capturing the pattern light by said image capturing device as an input; determining data representing a direction from said image capturing device to a point on a surface of the target object, to which the pattern light is projected from said pattern projector, and a direction from the projector to the point using the input image; estimating an internal parameter of said pattern projector, an internal parameter of said image capturing device, and a relative positional relationship between said pattern projector and said image capturing device by solving an epipolar constraint condition as to said pattern projector and said image capturing device using the data; and estimating 3D coordinates representing the surface of said target object by a principle of triangulation using the data and the internal parameters of said pattern projector and said image capturing device and the relative positional relationship therebetween; and measuring a 3D shape based on the estimated 3D coordinate of the surface of said target object and the estimated internal parameters of said pattern projector and said image capturing device and the estimated relative positional relationship therebetween, wherein the 3D coordinates of the surface of said target object are estimated without providing a specific assumption as to said pattern projector and said image capturing device and without previously measuring the internal parameters of said pattern projector and said image capturing device and the relative positional relationship therebetween.
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30. A measuring apparatus comprising:
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a pattern projector that emits pattern light to a target object; an image capturing device that captures the pattern light, the pattern projector and the image capturing device having a fixed relative positional relationship; a 3D coordinate estimating section that estimates the 3D coordinates representing a surface of said target object from the captured pattern light by determining data representing a direction from said image capturing device to a point on the surface of the target object, to which the pattern light is projected from said pattern projector, and a direction from the projector to the point on the surface of the target object using the input image, estimating an internal parameter of said pattern projector, an internal parameter of said image capturing device, and a relative positional relationship between said pattern projector and said image capturing device by solving an epipolar constraint condition as to said pattern projector and said image capturing device using the data, and estimating 3D coordinates representing the surface of said target object by a principle of triangulation using the data and the internal parameters of said pattern projector and said image capturing device and the relative positional relationship therebetween, wherein the 3D coordinates representing the surface of said target object can be estimated without providing a specific assumption as to said pattern projector and said image capturing device and without previously measuring the internal parameters of said pattern projector and said image capturing device and the relative positional relationship therebetween.
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31. A measuring method using a pattern projector and an image capturing device having a fixed relative positional relationship to each other, comprising
emitting a pattern light to a target object by said pattern projector; -
obtaining a plurality of image sets as an input, said plurality of image sets being obtained by capturing said image sets a plurality of times while changing a position of said target object; determining data representing a direction from said image capturing device and said projector to a point on said target object using said image sets as the input when said image sets are captured; estimating an internal parameter of said pattern projector, an internal parameter of said image capturing device, and a relative positional relationship between said pattern projector and said image capturing device by solving an epipolar constraint condition as to said pattern projector and said image capturing device using the direction data; and estimating 3D coordinates of the surface of said target object corresponding to the respective image sets by a principle of triangulation from the direction data, the estimated internal parameters of said pattern projector and said image capturing device, and the estimated relative positional relationship between said pattern projector and said image capturing device, wherein the 3D coordinates representing the surface of said target object is estimated as to the plurality of positions of said target object, accuracy of the 3D coordinate of the surface of said target object obtained as to each of said plurality of positions can be improved, and scalings are made consistent to each other, without previously measuring the internal parameters of said pattern projector and said image capturing device and the relative positional relationship therebetween. - View Dependent Claims (32, 33, 34, 35)
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36. A measuring apparatus, comprising:
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a pattern projector that emits pattern light to a target object; and an image capturing device that captures an image of the pattern light, said pattern projector and said image capturing device having a fixed relative positional relationship to each other, said image being formed as one image set; an image set obtaining section that obtains a plurality of image sets by repeating the capturing of the image while changing a position of said target object; and a 3D coordinate estimating section that estimates 3D coordinates representing a surface of said target object from the respective obtained image sets therefrom by determining data of a directions from said image capturing device and said projector to a point on said target object using said image sets as the input when said image sets are captured, estimating an internal parameter of said pattern projector, an internal parameter of said image capturing device, and a relative positional relationship between said pattern projector and said image capturing device by solving an epipolar constraint condition as to said pattern projector and said image capturing device using the direction data, and estimating 3D coordinates representing the surface of said target object corresponding to the respective image sets by a principle of triangulation from the direction data, the estimated internal parameters of said pattern projector and said image capturing device, and the estimated relative positional relationship between said pattern projector and said image capturing device, wherein the 3D coordinate representing the surface of said target object is estimated as to the plurality of positions of said target object, accuracy of the 3D coordinates representing the surface of said target object obtained as to each of said plurality of positions is improved, and scalings is made consistent to each other, without previously measuring the internal parameters of said pattern projector and said image capturing device and the relative positional relationship therebetween. - View Dependent Claims (37, 38, 39, 40)
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Specification