Method and Apparatus to Facilitate Testing of Printed Semiconductor Devices
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Abstract
A printing platform receives (102) (preferably in-line with a semiconductor device printing process (101)) a substrate having at least one semiconductor device printed thereon and further having a test structure printed thereon, which test structure comprises at least one printed semiconductor layer. These teachings then provide for the automatic testing (103) of the test structure with respect to at least one static (i.e., relatively unchanging) electrical characteristic metric. The static electrical characteristic metric (or metrics) of choice will likely vary with the application setting but can include, for example, a measure of electrical resistance, a measure of electrical reactance, and/or a measure of electrical continuity. Optionally (though preferably) the semiconductor device printing process itself is then adjusted (105) as a function, at least in part, of this metric.
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Citations
20 Claims
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1-12. -12. (canceled)
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13. A semiconductor device printing platform comprising:
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at least one printing station having a substrate receiver, a semiconductor device materials printer, and a printed substrate output, wherein the semiconductor device materials printer is configured and arranged to print both a functional semiconductor device and a test structure, which test structure comprises at least one printed semiconductor layer; at least one testing station having an input to receive printed substrates from the printing station and being configured and arranged to automatically test the test structure with respect to at least one static electrical characteristic metric. - View Dependent Claims (14, 15, 16, 17, 18, 19, 20)
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Specification