POSITION SENSOR

• US 20090102460A1
• Filed: 07/25/2008
• Published: 04/23/2009
• Est. Priority Date: 07/27/2007
• Status: Abandoned Application

• Current Assignee: Melexis Microelectronic Integrated Systems
• Original Assignee: Melexis NV Microelectronic Integrated Systems
• Inventors: Buchaillard, Alain, Schott, Christian
• Application Number:
  US12/180,274
• Publication Number:
  US 20090102460A1
• Time in Patent Office: Days
• US Class Current: 324/207.200
• CPC Class Codes: G01D 5/145 influenced by the relative movement between the Hall device and magnetic fields see G01R33/06
• CPC Class Codes: G01D 5/244 influencing characteristics of pulses or pulse trains; generating pulses or pulse trains

Abstract

A method of determining the position of a probe relative to a scale wherein the probe contains a sensor of the type comprising one or more pairs of orthogonal sensing elements X, Y operable to measure properties varying locally with the position of the probe relative to the scale. In use, a sinusoidally varying bias Ix, Iy is applied to each of the elements X, Y. The resultant outputs of elements X and Y are fed to summing means 101 and difference means 102. The summing means 101 is operable to output a summed signal Vsum equal to the instantaneous sum of Vx and Vy. The difference means 102 is operable to output a difference signal Vdiff equal to the instantaneous difference between Vx and Vy. The outputs Vsum and Vdiff are fed into a phase comparator 103, which is operable to determine the phase difference between them. The phase angle between Vsum and Vdiff provides an indication of the position of the probe relative to the scale. In alternative embodiments the phase angle between either Vsum or Vdiff and the bias signal may be used to Vdiff provides an indication of the position of the probe relative to the scale. In various embodiments, the above method is applied to both linear and rotary systems using magnetic or optical sensing elements.

Claims

1. A method of determining the position of a probe relative to a scale wherein the probe contains a sensor of the type comprising one or more pairs of orthogonal sensing elements operable to measure properties varying locally with the position of the probe relative to the scale, the method comprising the steps of:

applying a periodically varying bias to each sensing element;

determining the sum of and/or the difference between the outputs of pairs of sensing elements to provide a sum output signal and/or a difference output signal for each pair of sensing elements; and

determining one of;

the phase difference between the sum and difference output signals;

the phase difference between the sum output signal and the applied bias;

or the phase difference between the difference output signal and the applied bias for each pair of sensing elements to thereby determine the position of the probe relative to the scale.

2. A method as claimed in claim 1 wherein the scale provides a single scale period of property variation and the method involves directly determining the absolute position of the probe relative to the scale.

3. A method as claimed in claim 1 wherein the scale provides multiple repeating scale periods of property variations and the method involves determining the position of the probe relative to a particular scale period and wherein the absolute position of the probe is determined by maintaining a count of successive scale periods.

4. A method as claimed in claim 1 wherein the periodically varying bias is a sinusoidal bias applied to the sensing elements in the or each pair 90°

out of phase.

5. A method as claimed in claim 1 wherein the phase difference angle between the sum or difference signal and either applied bias signal is used to determine the probe position and the phase difference angle between the sum output and the difference output is used to improve the resolution of the determined probe position.

6. A method as claimed in claim 1 wherein the phase difference is determined by the use of a phase comparator to output a pulse width modulated signal wherein the duty period varies in proportion to the determined phase difference between zero and full width over a full scale period.

7. A method as claimed in claim 6 wherein the pulse width modulated signal is converted to an analogue output by low pass filtering.

8. A method as claimed in claim 6 wherein the pulse width modulated signal is converted to a digital signal by starting a counter upon each rising pulse and stopping said counter on each falling pulse, the counter being clocked by a signal having the same timebase as the applied bias.

9. A method as claimed in claim 1 wherein the property sensed by the sensing element is the local magnetic field and wherein the applied periodic bias is a sinusoidal bias current.

10. A method as claimed in claim 1 wherein the property sensed by the sensing element is the local radiation intensity and wherein the applied periodic bias is a sinusoidal variation in the intensity of the light source or a sinusoidal bias applied to the output of the sensing elements.

11. A position sensor for sensing the position of a probe relative to a scale comprising:

one or more pairs of sensing elements;

bias generating means operable to apply a periodic bias to each sensing element;

one or both of summing means for calculating a sum output signal for each pair of sensing elements the sum output signal being the sum of the outputs of the pair of sensing elements and difference means for calculating a difference output signal for each pair of sensing elements the difference output signal being the difference between the outputs of the pair of sensing elements; and

phase comparator means for determining one of;

the phase difference between the sum and difference output signals;

the phase difference between the sum output signal and the applied bias;

or the phase difference between the difference output signal and the applied bias for each pair of sensing elements to thereby determine the position of the probe relative to the scale.

12. A position sensor as claimed in claim 11 wherein the sensing elements in the or each pair are orientated or positioned such that the pair of sensing elements obtain output signals that are substantially 90°

out of phase.

13. A position sensor as claimed in claim 11 wherein either:

the probe is fixed and the scale is moveable;

or the scale is fixed and the probe is movable and wherein relative movement is rotational and the scale is or incorporates a rotor such as a shaft, a switch element, a disc, a rotary encoder.

14. A position sensor as claimed in claim 11 wherein either:

the probe is fixed and the scale is moveable;

or the scale is fixed and the probe is movable and wherein relative movement is linear and the scale is or incorporates a track or a rod.

15. A position sensor as claimed in claim 11 wherein the monitored property is a magnetic field, and the sensing elements are magnetic field sensing elements such as Hall elements, anisotropic magneto resistors (AMR), giant magneto resistors (GMR) or tunneling magneto resistors (GMR).

16. A position sensor as claimed in claim 15 wherein the scale may comprise alternating bands of magnetic material of opposite polarity defining a scale period and the probe comprises either a pair of orthogonally orientated magnetic sensing elements or a pair of magnetic sensing elements having a parallel orientation and a lateral separation equal to half the width of each band.

17. A position sensor as claimed in claim 15 wherein the scale comprises a plurality of regularly spaced projecting teeth defining a scale period and the probe comprises either a pair of magnetic sensing elements having a parallel orientation and a lateral separation equal to half the width of each tooth.

18. A position sensor as claimed in claim 15 wherein the scale comprises a magnetic rotor having a magnetic axis substantially perpendicular to its axis of rotation defining a single scale period and the probe comprises a pair of orthogonally orientated magnetic sensing elements.

19. A position sensor as claimed in claim 11 wherein the scale comprises a pair of encoding tracks, each track having sinusoidally varying reflection or transmission properties and the probe comprises a pair of radiation sensing elements, each sensing element being operable to detect radiation reflected or transmitted from one of the tracks and wherein the sinusoidal variation is 90°

out of phase between the tracks.

20. A position sensor as claimed in claim 19 wherein the tracks comprise a single period of sinusoidal variation along their length or comprise multiple periods of sinusoidal variation along their lengths.

21. A method of removing inherent offset from an output signal of a Hall element of the type having a pair of biasing contacts (designated supply negative SN and supply positive SP) and a pair of output contacts (designated output negative ON and output positive OP), the method comprising the steps of:

commutating connection to the contacts such that each of the contacts is operable as each of the pair of bias contacts SN, SP and operable as each of the output contacts ON, OP in a regular cycle; and

applying a suitable filter to the obtained output such that the element due to the inherent offset signal is substantially removed but the element due to the true Hall output signal is substantially retained.

22. A method as claimed in claim 21 wherein the designated bias contacts are driven by a sinusoidally varying bias current.

23. A method as claimed in claim 21 wherein the obtained output signal is amplified and wherein the applied filter is operable to remove offset introduced by amplification in addition to offset inherent to the Hall element.

24. A method as claimed in claim 21 wherein the commutation is arranged such that each contact is operable as each of as each of the pair of bias contacts SN, SP and as each of the output contacts ON, OP in turn in a four step unidirectional rotating cycle around the Hall element each contact being operable in sequence as SN, OP, SP, ON in turn.

25. A method as claimed in claim 21 wherein the bias contacts and the output contacts change function according to contra-rotational cycles and one opposing pair of contacts are each operable in sequence as SN, ON, SP, OP in turn and the other opposing pair of contacts are each operable in sequence as ON, SN, OP, SP.

26. A method as claimed in claim 21 wherein the commutation cycle is controlled by a switching means in response to a chopping signal and wherein the filter comprises a band pass filter, the upper cutoff frequency being less than the frequency of the chopping signal and the lower cutoff frequency being greater than the frequency of the sinusoidal bias current.

27. A method as claimed in claim 21 wherein the commutation cycle is controlled by a modulator in response to an input modulation signal and wherein the filter means comprises a demodulator operable in response to a signal substantially identical to the input modulation signal.

28. An offset removal circuit for removing inherent offset from an output signal of a Hall element of the type having a pair of biasing contacts (designated supply negative SN and supply positive SP) and a pair of output contacts (designated output negative ON and output positive OP), the circuit comprising:

commutation means operable to apply a commutation cycle to the contacts;

means for applying a bias current to the currently operable bias contacts;

means for receiving an obtained output signal from the currently operable output contacts; and

filter means for applying a filter to the obtained output signal such that such that the element due to the inherent offset signal is substantially removed but the element due to the true Hall output signal is substantially retained.