Metric based performance monitoring method and system

• US 20090105865A1
• Filed: 08/27/2008
• Published: 04/23/2009
• Est. Priority Date: 10/18/2007
• Status: Active Grant

• Current Assignee: Yokogawa Electric Corporation
• Original Assignee: Yokogawa Electric Corporation
• Inventors: Lee, Joseph Ching Hua, Vishwasrao, Sharad, Ornelas, Emelin, Kashyap, Naveen
• Granted Patent: US 7,877,232 B2
• Time in Patent Office: Days
• US Class Current: 700/111
• CPC Class Codes: G05B 23/0294 Optimizing process, e.g. process efficiency, product quality

Abstract

A metric based performance monitoring A process control system is disclosed in which diagnostics are performed at multiple levels of the plant, results of the diagnostics converted into Key Performance Indicators and compared to predetermined benchmarks such that an integrated and overall determination of the plants'"'"' performance may be displayed.

Claims

1. A method of monitoring the performance of a plant including devices, control loops and equipment comprising:

a. performing diagnostics at a device level, control loop level and equipment level;

b. converting results of the diagnostics of each of said levels into respective KPIs;

c. comparing said KPIs with predetermined operating benchmarks for each of the said devices, control loops and equipment; and

d. determining the performance levels of each of said devices, loops and equipment.

2. The method of claim 1 including the step of displaying said performance levels to plant personnel.

3. The method of claim 2 including the step of displaying different performance levels to different plant personnel.

4. The method of claim 2 including the step of colour coding said performance levels.

5. The method of claim 2 including the step of displaying the performance level as only three levels of performance.

6. The method of claim 5 wherein the displayed levels correspond to performance levels as being excellent, good but deteriorating or bad.

7. The method of claim 1 including the step of drilling down from the equipment level to the device level.

8. The method of claim 1 including the step of drilling up from the device level to the equipment level.

9. The method of claim 1 including the step of continuing plant production while performing steps a-f.

10. A system for monitoring the performance of a plant including devices, control loops and equipment comprising:

a. a diagnostic means for performing diagnostics at a device level, control loop level and equipment level;

b. a converting means for converting results of the diagnostics of each of said levels into respective KPIs; and

c. a comparing means for comparing said KPIs with predetermined operating benchmarks for each of the said devices, control loops and equipment for determining the performance levels of each of said devices, loops and equipment.