System for Measuring Electric Signals

• US 20090112080A1
• Filed: 04/23/2007
• Published: 04/30/2009
• Est. Priority Date: 04/21/2006
• Status: Abandoned Application

• Current Assignee: Quantum Applied Science And Research, Inc.
• Original Assignee: Quantum Applied Science And Research, Inc.
• Inventors: Matthews, Robert
• Application Number:
  US12/298,002
• Publication Number:
  US 20090112080A1
• Time in Patent Office: Days
• US Class Current: 600/393
• CPC Class Codes: A61B 5/30 Input circuits therefor
• CPC Class Codes: A61B 5/308 for electrocardiography [ECG]
• CPC Class Codes: A61B 5/6804 Garments; Clothes
• CPC Class Codes: H04R 29/00 Monitoring arrangements; Testing arrangements for hearing aids H04R25/30; detection of loudspeaker connection H04R5/04; sound-field adaptation dependent on speaker detection H04S7/308

Abstract

A system for determining if signals present at bioelectric sensors derive from an intended source or from different, localized sources or artifacts includes a first sensor placed to detect the electric potential of interest and generate a first electric signal possibly representative of the electric potential of interest and a second sensor placed near the first sensor and preferably a relatively large distance away from the source. The second sensor detects the electrical potential of interest and generates a second electrical signal which also possibly represents the electrical potential of interest. An electronic circuit determines whether a difference between the electrical signals exceeds a certain threshold, thus indicating that either one or both of the signals is a measure of an artifact and not the electric potential of interest.

Claims

1. A sensor system for measuring an electric potential of interest generated by a distant source in a body in the presence of locally produced artifacts comprising:

a first sensor placed at a first measurement location for detecting the electric potential of interest and generating a first electrical signal possibly representative of the electric potential of interest;

a second sensor placed at a second measurement location near the first sensor for detecting the electrical potential of interest and generating a second electrical signal possibly representative of the electric potential of interest;

a comparator for comparing the first and second electrical signals to produce a comparison result; and

an electronic circuit for determining if the comparison result suggests that the first and second electrical signals represent the electric potential of the source of interest or locally produced artifacts.

2. The sensor system according to claim 1, further comprising:

first and second adjusters for altering the first and second electrical signals respectively to compensate for changes in the first and second electrical signals caused by placement of the sensors or electrical characteristics of the sensors, wherein the comparator compares the first and second electrical signals after the first and second electrical signals are altered.

3. The sensor system according to claim 1, further comprising:

a threshold generator for setting a threshold level wherein the electronic circuit compares the comparison result of a difference between the first and second electrical signals with the threshold level to determine if the first and second electrical signals represent the electric potential of the source of interest.

4. The sensor system according to claim 3, wherein the threshold level is a static value.

5. The sensor system according to claim 3, wherein the threshold level is a dynamic value.

6. The sensor system according to claim 3, wherein the first and second electrical signals include timing data and the comparator measures a time offset of the time data between the first and second electrical signals.

7. The sensor system according to claim 2, wherein the first adjuster filters the first electrical signal to account for known changes caused to a measured electrical signal if a sensor is moved from the second measurement location to the first measurement location.

8. The sensor system according to claim 1, further comprising:

a third sensor placed at a third measurement location for detecting the electric potential of interest and generating a third electrical signal possibly representative of the electric potential of interest;

a fourth sensor placed at a fourth measurement location near the third sensor for detecting the electrical potential of interest and generating a fourth electrical signal possibly representative of the electric potential of interest; and

wherein the third and fourth electrical signals are compared to produce a second comparison result and the second comparison result is used to determine if the third and fourth electrical signals represent the electric potential of the source of interest or locally produced artifacts.

9. The sensor system of claim 1, further comprising:

an ear piece which contains at least one of the first and second sensors;

an audio generating device for creating audio signals worn in proximate contact to the body; and

cables carrying the audio signals and the first and second electrical signals from the sensors to the comparator and the electronic circuit.

10. The sensor system of claim 1, further comprising:

a garment, wherein the sensors are incorporated into the garment.

11. The sensor system of claim 10, wherein the garment has arms and the sensors are incorporated into the arms of the garment.

12. The sensor system of claim 10, wherein the sensors are removably attached to the garment.

13. The sensor system of claim 10, wherein the electronic circuit is readily detachable from the garment.

14. The sensor system according to claim 10, wherein the garment has shoulders and the sensors are incorporated into the shoulders of the garment.

15. The sensor system according to claim 1, further comprising:

a common carrier, wherein the first and second sensors are supported by the common carrier.

16. A sensor system for measuring an electric potential of interest generated by a distant source in a body in the presence of locally produced artifacts comprising:

a first sensor placed at a first measurement location for detecting the electric potential of interest and generating a first electrical signal possibly representative of the electric potential of interest; and

a second sensor placed at a second measurement location near the first sensor for detecting the electric potential of interest and generating the second electrical signal possibly representative of the electric potential of interest;

means for comparing the first and second signals and generating a comparison result; and

means for determining if the comparison result suggests that the first and second signals are sufficiently similar to each other that they describe the electrical potential of interest as opposed to some locally produced artifacts.

17. The sensor system according to claim 16, further comprising:

means for adjusting the first and second signals to compensate for differences between the sensors due to differing individual characteristics or placement wherein the comparing means compares the first and second electrical signals after the first and second electrical signals are altered.

18. The sensor system according to claim 16, further comprising:

means for establishing a threshold level; and

means for comparing the comparison result with the threshold level to determine whether or not the first and second electrical signals represent the electric potential of interest.

19. The sensor system according to claim 18, wherein the first and second electrical signals include timing data and wherein the sensor system further comprises means for determining if time offset data in the first and second electrical signals provided by the two sensors indicates that they describe the source of interest as opposed to locally produced artifacts.

20. The sensor system according to claim 16, further comprising:

means for filtering the first electrical signal to account for known changes in an electrical signal caused by moving a sensor from the second measurement location to the first measurement location.

21. The sensor system according to claim 16, further comprising:

a common carrier, wherein the first and second sensors are supported by the common carrier.

22. A method of measuring an electric potential of interest generated by a relatively distant source in a body in the presence of locally produced artifacts comprising:

generating a first electrical signal at a first measurement location possibly representative of the electric potential of interest; and

generating a second electrical signal at a second measurement location possibly representative of the electric potential of interest;

comparing the first and second electrical signals to produce a comparison result; and

determining from the comparison result which portions of the first and second electrical signals actually represent the electrical potential of interest and which portions represent locally produced artifacts.

23. The method of claim 22, further comprising:

adjusting the first and second electrical signals to compensate for differences in sensor electrical characteristics and creating first and second altered electrical signals, wherein the first and second altered electrical signals are compared after the first and second electrical signals are altered.

24. The method of claim 22, further comprising:

developing a threshold level and comparing the comparison result with the threshold level to determine if the signal represents the electrical potential of the source of interest or locally produced artifacts.

25. The method of claim 24, further comprising:

determining a time offset of the first and second electrical signals.

26. The method of claim 22, further comprising:

filtering data from the first electrical signal to account for known changes caused to a measured signal if a sensor generating the second electrical signal is moved from the second measurement location to the first measurement location.

27. The method of claim 22, further comprising:

removing portions of the first and second signals that represent locally produced artifacts;

generating a third electrical signal at a third measurement location possibly representative of the electric potential of interest; and

generating a fourth signal at a fourth measurement location possibly representative of the electric potential of interest;

comparing the third and fourth electrical signals to produce a second comparison result;

determining from the second comparison result which portions of the third and fourth electrical signals actually represent the electrical potential of interest and which portions represent locally produced artifacts;

removing portions of the third and fourth signals that represent locally produced artifacts; and

combining portions of the first and second signals that represent the electric potential of interest with portions of the third and fourth signals that represent the electric potential of interest to produce a composite signal that represents the electric potential of interest.

28. The method of claim 22, further comprising:

supporting first and second sensors, which generate the first and second electrical signals respectively, on a common housing or carrier.