Method and system for providing test and measurement guidance

• US 20090112505A1
• Filed: 10/25/2007
• Published: 04/30/2009
• Est. Priority Date: 10/25/2007
• Status: Abandoned Application

• Current Assignee: JDS Uniphase Corporation (Lumentum Holdings Inc.)
• Original Assignee: JDS Uniphase Corporation (Lumentum Holdings Inc.)
• Inventors: Engel, Glenn R., Burch, Jefferson B., Purdy, Glen L. JR.
• Application Number:
  US11/977,664
• Publication Number:
  US 20090112505A1
• Time in Patent Office: Days
• US Class Current: 702/123
• CPC Class Codes: G01D 21/00 Measuring or testing not otherwise provided for

Abstract

A method for providing a user with test and measurement guidance includes collecting an inventory of available test instruments, providing data for a device under test, providing a test specification, and generating a set of tests to be performed on the device under test utilizing the inventory, data, and test specification.

Claims

1. A method for providing a user with test and measurement guidance comprising:

collecting an inventory of available test instruments;

providing data for a device under test;

providing a test specification; and

generating a set of tests to be performed on the device under test utilizing the inventory, data, and test specification.

2. The method of claim 1, further comprising collecting an inventory of available test instruments by automatic communication or signal sensing.

3. The method of claim 1, further comprising collecting an inventory of available test instruments by manual input.

4. The method of claim 1, wherein the data for the device under test includes information about the design and operation of the device under test.

5. The method of claim 4, wherein the information about the design and operation of the device under test includes one or more of circuit descriptions and interconnections among circuits within the device under test.

6. The method of claim 1, further comprising generating a set of tests to be performed on the device under test by:

determining a set of tests and measurements that may be performed on the device under test;

selecting tests and measurements from the determined set; and

providing instrument selection and interconnection information from the selected tests and measurements.

7. A software program or product stored on a computer readable medium, for executing the method of claim 1, when run on a data processing system.

8. A module for providing a user with test and measurement guidance comprising:

a memory device for storing a test system inventory and metadata and a test specification for a device under test; and

a processor operable to analyze the test system inventory, metadata and test specification, and determine a set of tests and measurements that may be performed on the device under test.

9. The module of claim 8, wherein the processor is further operable to collect an inventory of available test instruments by automatic communication or signal sensing.

10. The module of claim 8, wherein the processor is further operable to collect an inventory of available test instruments by receiving manual input from a user.

11. The module of claim 8, wherein the metadata for the device under test includes information about the design and operation of the device under test.

12. The module of claim 11, wherein the information about the design and operation of the device under test includes one or more of circuit descriptions and interconnections among circuits within the device under test.

13. The module of claim 8, wherein the processor is further operable to select tests and measurements from the determined set and to provide a user with instrument selection and interconnection information.

14. A system comprising:

a test system having one or more test instruments for testing a device; and

a module connected to the test system through a network, the module including;

a memory device for storing a test system inventory and metadata and a test specification for a device under test; and

a processor operable to analyze the test system inventory, metadata and test specification, and determine a set of tests and measurements that may be performed on the device under test.

15. The system of claim 14, wherein the processor is further operable to collect an inventory of available test instruments by automatic communication or signal sensing.

16. The system of claim 14, wherein the processor is further operable to collect an inventory of available test instruments by receiving manual input from a user.

17. The system of claim 14, wherein the metadata for the device under test includes information about the design and operation of the device under test.

18. The system of claim 14, wherein the information about the design and operation of the device under test includes one or more of circuit descriptions and interconnections among circuits within the device under test.

19. The system of claim 14, wherein the processor is further operable to select tests and measurements from the determined set and to provide a user with instrument selection and interconnection information.