TERAHERTZ DISPERSIVE SPECTROMETER SYSTEM

• US 20090114822A1
• Filed: 11/06/2007
• Published: 05/07/2009
• Est. Priority Date: 11/06/2007
• Status: Abandoned Application

• Current Assignee: Honeywell International Inc.
• Original Assignee: Honeywell International Inc.
• Inventors: Fritz, Bernard S., Nusseibeh, Fouad, Cox, James A.
• Application Number:
  US11/935,917
• Publication Number:
  US 20090114822A1
• Time in Patent Office: Days
• US Class Current: 250/341.100
• CPC Class Codes: G01J 3/42 Absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry beam switching arrangements G01J3/08
• CPC Class Codes: G01J 5/0837 Microantennas, e.g. bow-tie
• CPC Class Codes: G01N 21/3581 using far infrared light; using Terahertz radiation

Abstract

A spectrometer system for providing information about a target with terahertz radiation. The system may receive incident radiation from the target through fore optics, a slit aperture, secondary optics and a dispersive element which images a slit on an array of terahertz sensitive detectors. The detectors may include uncooled sensors. Each sensor may be connected to its own micro antenna. The array of detectors may be situated proximate to the dispersive element so that radiation from the element may be dispersed according to wavelength to the respective detectors optimally sensitive to the various respective wavelengths. Detector signals indicating the impingement of terahertz radiation may provide information for identifying a material of the target.

Claims

1. A spectrographic system comprising:

a slit aperture

a dispersive element in an optical path from the slit aperture;

one or more detectors in an optical path from the dispersive element; and

optics as needed situated in the optical paths; and

wherein the one or more detectors comprise uncooled THz-sensitive sensors.

2. The system of claim 1, wherein the one or more detectors are arranged according to their optimal sensitivity in a spectral range of interest as defined by the dispersive range of the dispersive element.

3. The system of claim 1, wherein the one or more detectors comprise a thermally isolated microbridge sensor element.

4. The system of claim 1, wherein each of the one or more detectors comprises:

a micro antenna; and

a microbridge sensor coupled to the micro antenna.

5. The system of claim 4, wherein at least one size dimension of the micro antenna at least partially determines a wavelength to which the microbridge sensor is sensitive.

6. A dispersive spectrometer system comprising:

a dispersive element;

a mechanism for conveying incident radiation to the dispersive element; and

one or more detectors for sensing radiation from the dispersive element; and

wherein the radiation is in the THz range.

7. The system of claim 6, wherein:

the mechanism is for conveying the incident radiation to the dispersive element via a slit;

the one or more detectors form an array of detectors; and

each detector of the array of detectors comprises an uncooled sensor.

8. The system of claim 6, wherein:

the one or more detectors are arranged in an array according to a magnitude of wavelength at their optimal sensitivity; and

the one or more detectors comprise at least one uncooled sensor.

9. The system of claim 7, wherein the one or more sensors are situated proximate to the dispersive element so that radiation from the dispersive element is dispersed in manner directed according to wavelength to respective detectors optimally sensitive to that wavelength.

10. The system of claim 6, wherein:

the one or more detectors comprise;

an uncooled sensor; and

a micro antenna connected to the uncooled sensor; and

the sensor is a MEMS microbridge sensor;

11. The system of claim 8, further comprising:

processing electronics connected to the one or more detectors; and

wherein the processing electronics is for receiving THz detection signals from the one or more detectors and portraying information from the signals as absorbance versus frequency data.

12. The system of claim 11, wherein the processing electronics is further for identifying a material that has properties which correlate with the absorbance versus frequency data.

13. The system of claim 7, wherein the sensor is selected from a group consisting of a bolometer sensor, a thermoelectric sensor, a pyroelectric sensor, a ferroelectric sensor, and the like.

14. The system of claim 7, further comprising:

a THz radiation source for illuminating a target; and

wherein the mechanism for conveying incident radiation is for conveying radiation from a target as incident radiation.

15. The system of claim 14, wherein the THz radiation ranges from about 0.1 THz to about 10 THz.

16. A spectroscopic method comprising:

receiving THz radiation through a slit;

dispersing the radiation from the slit according to wavelength; and

selecting one or more detectors that have optimum sensitivity in a spectral range as defined by the dispersing the radiation according to wavelength; and

wherein the one or more detectors comprise an uncooled sensor.

17. The method of claim 16, further comprising placing the one or detectors so as to receive dispersed radiation in an optimal fashion according to the spectral range as defined by the dispersing the radiation according to wavelength.

18. The method of claim 17, further comprising receiving detection signals from the one or more detectors and portraying information from the signals as material identifying data.

19. The method of claim 18, further comprising:

converting the material identifying data into absorbance versus frequency data; and

identifying one or more materials that may have properties which correlate with the absorbance versus frequency data.

20. The method of claim 16, wherein the uncooled sensor is a microbridge sensor selected from a group consisting of a bolometer sensor, a thermoelectric sensor, a pyroelectric sensor, a ferroelectric sensor, and the like.