HIGH DENSITY INTEGRATED CIRCUIT APPARATUS, TEST PROBE AND METHODS OF USE THEREOF
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Accused Products
Abstract
The present invention is directed to a high density test probe which provides a means for testing a high density and high performance integrated circuits in wafer form or as discrete chips. The test probe is formed from a dense array of elongated electrical conductors which are embedded in an compliant or high modulus elastomeric material. A standard packaging substrate, such as a ceramic integrated circuit chip packaging substrate is used to provide a space transformer. Wires are bonded to an array of contact pads on the surface of the space transformer. The space transformer formed from a multilayer integrated circuit chip packaging substrate. The wires are as dense as the contact location array. A mold is disposed surrounding the array of outwardly projecting wires. A liquid elastomer is disposed in the mold to fill the spaces between the wires. The elastomer is cured and the mold is removed, leaving an array of wires disposed in the elastomer and in electrical contact with the space transformer The space transformer can have an array of pins which are on the opposite surface of the space transformer opposite to that on which the elongated conductors are bonded. The pins are inserted into a socket on a second space transformer, such as a printed circuit board to form a probe assembly. Alternatively, an interposer electrical connector can be disposed between the first and second space transformer.
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Citations
43 Claims
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1-28. -28. (canceled)
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29. A structure comprising:
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a plurality of first substrates adapted to be mounted to a second substrate; each of the first substrate having two opposite surfaces; free standing flexible conductors extending from one of the two surfaces shaped so that a free end thereof laterally movers when pressed against a surface; terminals on an other of the two opposite surfaces; means, within each of the first substrates, for connecting the terminals to the contacts; and the plurality of the first substrates are mounted on to the second substrate. - View Dependent Claims (30, 31, 32, 33)
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34. A structure comprising:
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at least one first substrate adapted to be mounted to a second substrate; said at least one first substrate has two opposite surfaces; free standing flexible conductors extending from one of the two surfaces shaped so that a free end thereof laterally movers when pressed against a surface; terminals on an other of the two opposite surfaces; means, within each of the first substrates, for connecting the terminals to the contacts; and said at least one first substrate is mounted on to the second substrate. - View Dependent Claims (35, 36, 37, 38)
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39. A structure comprising:
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a first substrate adapted to be mounted to a second substrate; the first substrate having two opposite surfaces; free standing flexible conductors extending from one of the two surfaces shaped so that a free end thereof laterally movers when pressed against a surface; terminals on an other of the two opposite surfaces; means, within the first substrate, for connecting the terminals to the contacts; and the plurality of the first substrates are mounted on to the second substrate. - View Dependent Claims (40, 41, 42, 43)
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Specification