Transmission line for dielectric measurement and dielectric measuring device having the transmission line

• US 20090134885A1
• Filed: 09/09/2008
• Published: 05/28/2009
• Est. Priority Date: 09/10/2007
• Status: Active Grant

• Current Assignee: Sony Corporation (Sony Group Corp.)
• Original Assignee: Sony Corporation (Sony Group Corp.)
• Inventors: Oshige, Ikuya, Omori, Shinji, Hayashi, Yoshihito
• Granted Patent: US 8,368,410 B2
• Time in Patent Office: Days
• US Class Current: 324/663
• CPC Class Codes: G01N 27/221 by investigating the dielectric properties using microwaves G01N22/00; measuring loss factors or dielectric constants per se G01R27/26
• CPC Class Codes: G01R 31/36 Arrangements for testing, measuring or monitoring the electrical condition of accumulators or electric batteries, e.g. capacity or state of charge [SoC]

Abstract

A transmission line substrate includes at least an insulating layer of a predetermined thickness, a pair of conductor layers arranged in a state of being opposed to each other such that the insulating layer is interposed between the conductor layers, the pair of conductor layers functioning as a high-frequency transmission line, and a fault part formed so as to make the conductor layer on one side disconnected, into which a sample to be measured can be introduced.

Claims

1. A transmission line substrate comprising at least:

an insulating layer of a predetermined thickness;

a pair of conductor layers arranged in a state of being opposed to each other such that said insulating layer is interposed between the conductor layers, the pair of conductor layers functioning as a high-frequency transmission line; and

a fault part formed so as to make said conductor layer on one side disconnected, into which a sample to be measured can be introduced.

2. The transmission line substrate according to claim 1, further comprising:

a flow path for sample introduction which flow path has said fault part as a part of the flow path.

3. A multiple transmission line substrate comprising:

a plurality of the high-frequency transmission lines of claim 1 arranged in parallel with each other.

4. The multiple transmission line substrate according to claim 3, wherein a flow path for sample introduction which passes a plurality of fault parts is formed.

5. An electrical measuring device for obtaining information on an electrical characteristic of a sample to be measured using the transmission line substrate of claim 1, said electrical measuring device comprising:

a power supply section configured to supply power to said conductor layers forming said transmission line substrate;

a sample introducing section configured to introduce the sample into said fault part directly or via a flow path; and

a measuring section configured to measure impedance that can be changed by introducing the sample into said fault part.

6. The electrical measuring device according to claim 5, further Comprising:

an analyzing section configured to obtain permittivity of the sample on a basis of said impedance.