System and Method for Focused Ion Beam Data Analysis
First Claim
1. A method for enhancing endpointing determination in a charged particle beam system operation involving material modification, comprising:
- a) receiving dwell point information from each frame generated by the CPB system, the information including dwell point intensity values;
b) processing the dwell point intensity values of a first region of interest of a first number of frames to derive raster data, and when the first region of interest is defined, mapping the raster data to an image palette and displaying the resultant raster image;
c) plotting a summation of the dwell point intensity values of a second region of interest of a second number of frames on an endpoint graph versus charged particle dose or rastering time, when the second region of interest is defined.
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Abstract
A system and method for improving FIB milling endpointing operations. The methods involve generating real-time images of the area being milled and real-time graphical plots of pixel intensities with an increased sensitivity over native FIB system generated images and plots. The images and plots are generated with raw signal data obtained from the native FIB system. More specifically, the raw signal data is processed according to specific algorithms for generating images and corresponding intensity graphs which can be reliably used for accurate endpointing. In particular, the displayed images will display more visual information regarding changes in milled material, while the intensity graphs will plot aggregate pixel intensity data on a dynamically adjusting scale to dramatically highlight relative changes in milled material.
48 Citations
42 Claims
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1. A method for enhancing endpointing determination in a charged particle beam system operation involving material modification, comprising:
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a) receiving dwell point information from each frame generated by the CPB system, the information including dwell point intensity values; b) processing the dwell point intensity values of a first region of interest of a first number of frames to derive raster data, and when the first region of interest is defined, mapping the raster data to an image palette and displaying the resultant raster image; c) plotting a summation of the dwell point intensity values of a second region of interest of a second number of frames on an endpoint graph versus charged particle dose or rastering time, when the second region of interest is defined. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20, 21, 22, 23, 24, 25, 26, 27, 28, 29, 30, 31, 32, 33, 34, 35, 36, 37, 38, 39)
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40. A method for imaging in a charged particle beam system operation involving material modification, comprising:
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a) receiving dwell point information from each frame generated by the CPB system, the information including dwell point intensity values; b) processing the dwell point intensity values of a region of interest of a number of frames to derive raster data, mapping the raster data to an image palette and displaying the resultant raster image stretched by a first predetermined factor greater than zero in a first axis and by a second predetermined factor greater than zero in a second axis. - View Dependent Claims (41, 42)
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Specification