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System and Method for Focused Ion Beam Data Analysis

  • US 20090135240A1
  • Filed: 11/15/2005
  • Published: 05/28/2009
  • Est. Priority Date: 11/15/2004
  • Status: Active Grant
First Claim
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1. A method for enhancing endpointing determination in a charged particle beam system operation involving material modification, comprising:

  • a) receiving dwell point information from each frame generated by the CPB system, the information including dwell point intensity values;

    b) processing the dwell point intensity values of a first region of interest of a first number of frames to derive raster data, and when the first region of interest is defined, mapping the raster data to an image palette and displaying the resultant raster image;

    c) plotting a summation of the dwell point intensity values of a second region of interest of a second number of frames on an endpoint graph versus charged particle dose or rastering time, when the second region of interest is defined.

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