ELECTRONIC THERMOMETER WITH FLEX CIRCUIT LOCATION

• US 20090135884A1
• Filed: 01/26/2009
• Published: 05/28/2009
• Est. Priority Date: 11/03/2005
• Status: Active Grant

• Current Assignee: Cardinal Health Ireland Unlimited Company (Cardinal Health, Inc.)
• Original Assignee: Covidien AG (Medtronic Plc)
• Inventors: Gierer, Joseph, Sisk, Ricky A., Davis, Mark A.
• Granted Patent: US 7,988,355 B2
• Time in Patent Office: Days
• US Class Current: 374/208
• CPC Class Codes: G01K 1/14 Supports; Fastening devices; Arrangements for mounting thermometers in particular locations
• CPC Class Codes: G01K 13/20 Clinical contact thermometers for use with humans or animals
• CPC Class Codes: Y10T 29/4913 Assembling to base an electrical component, e.g., capacitor, etc.

Abstract

An electronic thermometer is configured for ease and accuracy in construction. A probe of the thermometer includes a flex circuit containing electronic components used to measure temperature and transmit signals to a calculating unit of the thermometer. A resilient locator can function to pre-position the flex circuit prior to final fixation so that the electronic components are reliably positioned in manufacture

Claims

1. An electronic thermometer comprising:

a probe tip adapted to be heated to a temperature by an object for use in measuring the temperature of the object;

a deformable circuit element including a deformable electrical conductor and at least one temperature sensor electrically connected to the electrical conductor for detecting the temperature of the probe tip;

a probe shaft supporting the probe tip and deformable circuit element and including an end portion; and

a locating member supported by the probe shaft formed for at least temporarily locating the deformable circuit element, said locating member comprising a resilient locator resiliently deformed by engagement with the deformable circuit element for biasing the deformable circuit element into a selected position.

2. An electronic thermometer as set forth in claim 1, wherein the resilient locator defines a cavity, said cavity permitting resilient deformation of the resilient locator that biases the deformable circuit element into said selected position.

3. An electronic thermometer as set forth in claim 1 further comprising a separator supported by the probe shaft.

4. An electronic thermometer as set forth in claim 3, wherein the deformable circuit element is biased by the resilient locator against an interior wall of the separator for achieving and maintaining contact with the separator.

5. An electronic thermometer as set forth in claim 4, wherein the deformable circuit element includes a pair of arms and an electronic device mounted on each arm, the resilient locator biasing the arms to urge the electronic devices against the interior wall of the separator.

6. An electronic thermometer as set forth in claim 1, further comprising a base unit and a cord connecting the probe shaft to the base unit.

7. A probe for an electronic thermometer comprising:

a probe tip adapted to be heated to a temperature by an object for use in measuring the temperature of the object;

a deformable circuit element including a deformable electrical conductor and at least one temperature sensor electrically connected to the electrical conductor for detecting the temperature of the probe tip;

a probe shaft supporting the probe tip and deformable circuit element and including an end portion; and

a locating member supported by the probe shaft formed for at least temporarily locating the deformable circuit element, said locating member comprising a resilient locator, said resilient locator being resiliently deformed by engagement with the deformable circuit element and biasing the deformable circuit element to a selected position.

8. A probe as set forth in claim 7, wherein the resilient locator defines a cavity, said cavity permitting resilient deformation of the resilient locator that biases the deformable circuit element into said selected position.

9. A probe as set forth in claim 7 further comprising a separator supported by the probe shaft.

10. A probe as set forth in claim 9, wherein the deformable circuit element is biased against an interior wall of the separator for achieving and maintaining contact with the separator.

11. A probe as set forth in claim 7, wherein the deformable circuit element includes a pair of arms and an electronic device mounted on each arm, the resilient locator biasing the arms to urge the electronic devices against the interior wall of the separator.

12. A method of making a probe for an electronic thermometer comprising:

deforming the deformable circuit element;

positioning a deformable circuit element together with a probe shaft;

connecting a locating member to the probe shaft, said locating member comprising a resilient locator; and

resiliently deforming the resilient locator by engagement with the deformable circuit element thereby to bias the deformable circuit element to a selected position.

13. A method as set forth in claim 12 further comprising connecting a separator to the probe shaft.

14. A method as set forth in claim 13 wherein resiliently deforming the resilient locator comprises biasing the deformable circuit element against an interior wall of the separator for achieving and maintaining contact with the separator.

15. A method as set forth in claim 12 wherein deforming the deformable circuit element comprises bending arms of the deformable circuit element to an arcuate shape.

16. A method as set forth in claim 15 wherein resiliently deforming the resilient locator comprises bring the resilient locator into contact with the bent arms of the deformable circuit element.