SCANNING PROBE MICROSCOPE AND MEASURING METHOD THEREBY

• US 20090140142A1
• Filed: 02/22/2006
• Published: 06/04/2009
• Est. Priority Date: 02/23/2005
• Status: Abandoned Application

• Current Assignee: Ken Murayama
• Original Assignee: Ken Murayama
• Inventors: Murayama, Ken
• Application Number:
  US11/816,870
• Publication Number:
  US 20090140142A1
• Time in Patent Office: Days
• US Class Current: 250/307
• CPC Class Codes: B82Y 35/00 Methods or apparatus for measurement or analysis of nanostructures
• CPC Class Codes: G01Q 10/065 Feedback mechanisms, i.e. wherein the signal for driving the probe is modified by a signal coming from the probe itself
• CPC Class Codes: G01Q 60/38 Probes, their manufacture, or their related instrumentation, e.g. holders

Abstract

A scanning probe microscope performs first scanning movement of a probe in X and Y directions along a sample surface while controlling the position of the probe in a Z direction by an XYZ fine movement mechanism. Measurement information about the sample surface is obtained by a measurement section and displacement detection section during the first scanning. A probe movement path is determined for a second scanning that includes a measuring spot in which a measurement including a parallel direction component to the sample surface to be performed on the probe movement path is determined, on the basis of the measurement information about the sample surface. As a result of performing the measurement including the parallel direction component based on the second scanning wear of the probe is reduced and measurement reliability and simplified movement control of the scanning of the probe is enabled.

Claims

1. A measuring method of a scanning probe microscope provided with a cantilever with a probe which is opposite to a sample, a XYZ fine movement mechanism for making displacement in each direction of three axes (two axes X and Y parallel to a sample surface, and an axis Z of a height direction to the sample surface) which intersect perpendicularly in a positional relationship between said probe and said sample, a movement mechanism for changing a relative position of said probe and said sample, a measurement means for measuring surface properties of said sample based on the physical amount generated between said probe and said sample when making said probe scan the surface of said sample, and a displacement detection means for detecting the displacement of said cantilever, wherein surface characteristic of said sample is measured by making said probe scan the surface of said sample while holding said physical amount to be constant, the measuring method characterized in comprising,

a first step of performing a first time scanning movement of said probe in both or either of X and Y directions along a surface of said sample while controlling the position of said probe in a Z direction on said sample according to a predetermined probe movement path by said movement mechanism and said XYZ fine movement mechanisms,

a second step of obtaining measuring information about the surface of said sample by said measurement means and said displacement detection means during said first step,

a third step of determining a probe movement path for a second time scanning and a measuring spot in which a measurement including a parallel direction component to the surface of said sample is performed on said probe movement path, on the basis of said measuring information about the surface of said sample obtained in said second step, and

a fourth step of performing the measurement including the parallel direction component based on said second time scanning.

2. A measuring method of a scanning probe microscope as set forth in claim 1, characterized in that said measuring spot in which the measurement including the parallel direction component to the surface of said sample is performed has a spot having a slope on the surface of said sample.

3. A measuring method of a scanning probe microscope as set forth in claim 1, characterized in that said probe is separated from the surface of said sample in an area except for the measuring spot in the surface of said sample in said probe movement path based on the scanning movement.

4. A measuring method of a scanning probe microscope as set forth in claim 1, characterized in that said probe has pointed ends directed to both or either of parallel and perpendicular directions to the surface of said sample.

5. A measuring method of a scanning probe microscope as set forth in claim 1, characterized in that said probe is disposed so that an axis of said probe is inclined to the surface of said sample.

6. A measuring method of a scanning probe microscope as set forth in claim 1, characterized in that the measurement including the parallel direction component to the surface of said sample in said fourth step is performed at one measuring point at least or required minimum measuring points, in which size measurement is required.

7. A measuring method of a scanning probe microscope as set forth in claim 1, characterized in that the measurement including the parallel direction component to the surface of said sample uses a torsion signal generated when said cantilever is twisted.

8. A measuring method of a scanning probe microscope as set forth in claim 1, characterized in that, when the surface of said sample is formed to have trenches, the measurement including the parallel direction component to the surface of said sample in said fourth step is performed to be parallel to the trenches.

9. A measuring method of a scanning probe microscope as set forth in claim 1, characterized in that, when the surface of said sample is formed to have holes, the measurement including the parallel direction component to the surface of said sample in said fourth step is performed to be along a circumference direction of the holes.

10. A measuring method of a scanning probe microscope as set forth in claim 1, characterized in that, when performing said first step and said fourth step in a going and returning scanning movement, said first step is performed in the going path and said fourth step is performed in the returning path.

11. A measuring method of a scanning probe microscope as set forth in claim 1, characterized in that the scanning movement in said fourth step is performed against the surface of said sample, based on the measuring information about the surface of said sample obtained by said first and second steps so that a movement direction at each of measuring points is along a normal direction of the sample surface.

12. A measuring method of a scanning probe microscope as set forth in claim 1, characterized by providing a fifth step of composing the measurement information obtained by said second step and the measurement information obtained by said fourth step.

13. A measuring method of a scanning probe microscope as set forth in claim 1, characterized in that both or either of a torsion signal and a flexure signal in said cantilever is used for detecting contact between said probe and said sample in the measurement including the parallel direction component based on said fourth step.

14. A measuring method of a scanning probe microscope as set forth in claim 1, characterized in that a first scanning performed in said first step is one line scanning of X direction (or Y direction), and a probe movement path and a measurement spot determined in said third step is made by repeatedly shifting a probe movement path and a measurement spot determined on the basis of information obtained by said second step to the Y direction (or X direction).

15. A measuring method of a scanning probe microscope as set forth in claim 1, characterized in that one point or several points are selected as points for obtaining measurement information during the first scanning in said second step, the probe movement path determined in said third step is a straight line determined by the measurement information obtained at said one point or several points, and the measurement including the parallel direction component to the sample surface in said fourth step is performed along the straight line.

16. A scanning probe microscope provided with a cantilever with a probe which is opposite to a sample, a XYZ fine movement mechanism for making displacement in each direction of three axes (two axes X and Y parallel to a sample surface, and an axis Z of a height direction to the sample surface) which intersect perpendicularly in a positional relationship between said probe and said sample, a movement mechanism for changing a relative position of said probe and said sample, a measurement means for measuring surface properties of said sample based on the physical amount generated between said probe and said sample when making said probe scan the surface of said sample, and a displacement detection means for detecting the displacement of said cantilever, and a control computer for changing a positional relationship between said probe and said sample by said XYZ fine movement mechanism and said movement mechanism, wherein surface characteristic of said sample is measured by making said probe scan the surface of said sample while holding said physical amount to be constant, the scanning probe microscope characterized in that said control computer is installed with a program for realizing,

a first function for performing a first time scanning movement of said probe in both or either of X and Y directions along a surface of said sample while controlling the position of said probe in a Z direction on said sample according to a predetermined probe movement path by said movement mechanism and said XYZ fine movement mechanism,

a second function for obtaining measuring information about the surface of said sample by said measurement means and said displacement detection means during said scanning,

a third function for determining a probe movement path for a second time scanning and a measuring spot in which a measurement including a parallel direction component to the surface of said sample is performed on said probe movement path, on the basis of said measuring information about the surface of said sample obtained in said measurement, and

a fourth function for performing the measurement including the parallel direction component based on said second time scanning.