System and method for electronic testing of devices

• US 20090144007A1
• Filed: 11/29/2007
• Published: 06/04/2009
• Est. Priority Date: 11/29/2007
• Status: Abandoned Application

• Current Assignee: Advantest Corporation
• Original Assignee: Advantest Corporation
• Inventors: KHOCHE, Ajay, MOREIRA, Jose, VOLKERINK, Erik
• Application Number:
  US11/998,616
• Publication Number:
  US 20090144007A1
• Time in Patent Office: Days
• US Class Current: 702/81
• CPC Class Codes: G01R 31/31707 Test strategies methods for generation of test sequences G01R31/318371
• CPC Class Codes: G01R 31/318357 Simulation computer simulation of digital circuits G06F30/3308
• CPC Class Codes: G01R 31/31907 Modular tester, e.g. controlling and coordinating instruments in a bus based architecture

Abstract

A system and method electronically tests devices. The method comprises receiving a first testing model including a first plurality of parameters and acceptable limits for the first plurality of parameters; receiving a second testing model including a second plurality of parameters and acceptable limits for the second plurality of parameters; receiving a first value for a first parameter from the first plurality of parameters, the first parameter at least partially affecting a second parameter from the second plurality of parameters; determining a second value for the second parameter based on the first value; determining if the first value is within the acceptable limits for the first parameter; determining if the second value is within the acceptable limits for the second parameter; and providing an indication when at least one of the first and second values is outside the acceptable limits for a corresponding one of the first and second parameters.

Claims

1. A method, comprising:

receiving a first testing model including a first plurality of parameters and acceptable limits for the first plurality of parameters;

receiving a second testing model including a second plurality of parameters and acceptable limits for the second plurality of parameters;

receiving a first value for a first parameter from the first plurality of parameters, the first parameter at least partially affecting a second parameter from the second plurality of parameters;

determining a second value for the second parameter based on the first value;

determining if the first value is within the acceptable limits for the first parameter;

determining if the second value is within the acceptable limits for the second parameter; and

providing an indication when at least one of the first and second values is outside the acceptable limits for a corresponding one of the first and second parameters.

2. The method of claim 1, wherein the first and second parameters pertain to a performance metric of a device.

3. The method of claim 1, further comprising:

when the first value is outside the acceptable limits for the first parameter, proffering a first solution so that the first value adjusts to be within the acceptable limits for the first parameter.

4. The method of claim 3, further comprising:

determining a resulting second value based on the first value adjusted by the first solution.

5. The method of claim 4, further comprising:

determining if the resulting second value is within the acceptable limits for the second parameter.

6. The method of claim 5, further comprising:

providing a second solution so that the first and second values are within the acceptable limits for the corresponding one of the first and second parameters.

7. The method of claim 6, wherein the second solution is one of altering a component of a device and altering at least one of the models.

8. The method of claim 1, wherein the first test model is a production model specifying parameters during a production phase.

9. The method of claim 1, wherein the second test model is one of a device model specifying parameters for a finished device and a standard model specifying parameters defined by an industry standard.

10. The method of claim 1, wherein the first and second parameters are identical.

11. The method of claim 1, wherein the first and second values are identical.

13. The system of claim 11, wherein the at least one measurement pertains to a performance parameter of the device.

14. The system of claim 11, wherein the processor proffers a first solution so that the first value adjusts to be within the acceptable limits for the first parameter when the first value is outside the acceptable limits for the first parameter.

15. The system of claim 14, wherein the processor determines a resulting second value based on the first value adjusted by the first solution.

16. The system of claim 15, wherein the processor determines if the resulting second value is within the acceptable limits for the second parameter.

17. The system of claim 16, wherein the processor provides a second solution so that the first and second values are within the acceptable limits for the corresponding one of the first and second parameters.

12. A system, comprising:

a memory storing a first testing model including a first plurality of parameters and acceptable limits for the first plurality of parameters and a second testing model including a second plurality of parameters and acceptable limits for the second plurality of parameters; and

a processor receiving a first value for a first parameter from the first plurality of parameters, the first parameter at least partially affecting a second parameter from the second plurality of parameters, the processor determining a second value for the second parameter based on the first value, the processor determining if the first value is within the acceptable limits for the first parameter and determining if the second value is within the acceptable limits for the second parameter, the processor outputting an indication when at least one of the first and second values is outside the acceptable limits for the corresponding one of the first and second parameters.

18. The system of claim 12, wherein the first test model is a production model specifying parameters during a production phase.

19. The system of claim 12, wherein the second test model is one of a device model specifying parameters for a finished device and a standard model specifying parameters defined by an industry standard.

20. The system of claim 12, wherein the first and second parameters are identical.

21. The system of claim 12, wherein the first and second values are identical.

22. A computer readable storage medium including a set of instructions executable by a processor, the set of instructions operable to:

receive a first testing model including a first plurality of parameters and acceptable limits for the first plurality of parameters;

receive a second testing model including a second plurality of parameters and acceptable limits for the second plurality of parameters;

receive a first value for a first parameter from the first plurality of parameters, the first parameter at least partially affecting a second parameter from the second plurality of parameters;

determine a second value for the second parameter based on the first value;

determine if the first value is within the acceptable limits for the first parameter;

determine if the second value is within the acceptable limits for the second parameter; and

provide an indication when at least one of the first and second values is outside the acceptable limits for a corresponding one of the first and second parameters.