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METHOD FOR TESTING A SEMICONDUCTOR DEVICE AND A SEMICONDUCTOR DEVICE TESTING SYSTEM

  • US 20090147255A1
  • Filed: 12/07/2007
  • Published: 06/11/2009
  • Est. Priority Date: 12/07/2007
  • Status: Abandoned Application
First Claim
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1. A method for testing a semiconductor device, the method comprising:

  • irradiating a transistor within the semiconductor device with a light beam, wherein the irradiating the transistor induces a current within the transistor; and

    in response to the irradiating, detecting photon emission from the transistor.

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