MICROWAVE DATUM TOOL

• US 20090153392A1
• Filed: 12/19/2006
• Published: 06/18/2009
• Est. Priority Date: 12/20/2005
• Status: Active Grant

• Current Assignee: Walleye Technologies, Inc.
• Original Assignee: Walleye Technologies, Inc.
• Inventors: Holbrook, David S., Adams, Christopher P.
• Granted Patent: US 8,451,162 B2
• Time in Patent Office: Days
• US Class Current: 342/22
• CPC Class Codes: G01N 22/00 Investigating or analysing materials by the use of microwaves or radio waves, i.e. electromagnetic waves with a wavelength of one millimetre or more G01N3/00 - G01N17/00, G01N24/00 take precedence

Abstract

In one aspect, a measurement system is disclosed that includes a source of microwave radiation having one or more wavelengths capable of penetrating through a visibly opaque obstruction, e.g., a wall. The source can be movably positioned on one side of the obstruction for illuminating thereof. The system can further include a microwave reflecting element disposed on another side of the obstruction, where the reflecting element is capable of reflecting at least a portion of the radiation transmitted through the obstruction. A plurality of radiation sensors are positioned relative to the obstruction so as to differentially detect at least a portion of the reflected radiation transmitted through the obstruction so as to determine a position of the source relative to the reflective element.

Claims

1. A measurement system, comprising

a source of radiation having one or more wavelengths capable of penetrating through an obstruction, said source being movably positioned on one side of the obstruction for illuminating thereof with said radiation,

a reflecting element disposed on another side of the obstruction, said reflecting element being capable of reflecting at least a portion of the radiation transmitted through the obstruction, and

a plurality of radiation sensors positioned relative to the obstruction so as to detect at least a portion of the reflected radiation transmitted through the obstruction so as to determine a position of said source relative to said reflective element.

2. The system of claim 1, wherein said obstruction is visibly opaque.

3. The system of claim 1, wherein said reflecting element is an imaging element.

4. The system of claim 1, wherein said sensors differentially detect said reflected radiation.

5. The system of claim 1, wherein said sensors are positioned as so to generate a null signal when said source and said reflective element are substantially aligned.

6. The system of claim 1, wherein said source generates microwave radiation with one or more frequency components in a range of about 1 GHz to about 24 GHz.

7. The system of claim 6, wherein said source generates microwave radiation with one or more frequency components in a range of about 1 GHz to about 2 GHz.

8. The system of claim 6, wherein said source generates microwave radiation with one or more frequency components in a range of about 10 GHz to about 20 GHz.

9. A measurement system, comprising

an electromagnetic imager adapted to generate images of an interior portion of a visibly opaque obstruction, said imager comprising a source coupled to a focusing element for focusing radiation directed to a proximal side of the obstruction into interior portion thereof and a detector for detecting at least a portion of the radiation propagating back from the obstruction, and

a reflective focusing element disposed on a distal side of the obstruction for reflecting at least a portion of the radiation propagating through the obstruction,

wherein said detector detects at least a portion of the radiation reflected by the reflective element for determining an alignment of said source relative to said reflective element.

10. The system of claim 9, wherein said obstruction comprises a wall, and said reflective focusing element has a focal length of about ¼

of a thickness of said wall.

11. The system of claim 9, wherein said imager source generates radiation with frequency components in a range of about 1 to about 24 GHz.

12. A measurement method, comprising

movably disposing a radiation source on one side of a visibly opaque obstruction, said source generating radiation having at least one wavelength capable of penetrating through said obstruction,

associating a reference element to a location at an opposed side of said obstruction, said element being reflective to said at least one wavelength,

directing a radiation beam having said wavelength from the source to the obstruction such that at least a portion of said radiation penetrates the obstruction to illuminate said reference element, and

detecting at least a portion of radiation reflected by said element at two or more spatially separate locations so as to determine a position of the source relative to the reflective element.

13. The method of claim 12, further comprising selecting said at least one wavelength to be in a range of about 1 GHz to about 24 GHz.

14. The method of claim 13, further comprising selecting said at least one wavelength to be in a range of about 10 GHz to about 20 GHz.

15. The method of claim 12, wherein said detecting step comprises differentially detecting said reflected radiation at said two or more locations.

16. The method of claim 12, wherein the step of associating said reflective element with a location comprises disposing said reflective element on a surface of said obstruction.

17. The method of claim 12, wherein the step of directing the radiation further comprises positioning the source so as to illuminate said reflective element by the radiation beam.

18. The method of claim 12, wherein determining a position of the source relative to the reflective element comprises determining an angle of incident of said radiation beam on said reflective element.

19. A measurement system, comprising

a source of radiation adapted to generate a radiation beam having at least one wavelength capable of penetrating a visibly opaque obstruction, said source being movably positioned on one side of the obstruction for illuminating thereof with said radiation beam, and

at least two sensors positioned on another side of the obstruction such that each sensor detects at least a portion of radiation transmitted through the obstruction so as to determine a position of said source relative to a reference point on said obstruction.

20. The system of claim 19, wherein said sensors are adapted to differentially detect said radiation.

21. The system of claim 20, wherein said sensors are adapted to generate a null signal when said source is aligned with said reference point.

22. The system of claim 20, wherein said radiation source is capable of generating radiation with one or more frequency components in a range of about 1 GHz to about 24 GHz.

23. The system of claim 22, wherein said radiation source is capable of generating radiation with one or more frequency components in a range of about 10 GHz to about 20 GHz.

24. A measurement method, comprising

directing microwave radiation along a measurement path,

determining attenuation of the radiation after at least one passage along said path, and

estimating metal content along said path based on said attenuation.

25. The method of claim 24, wherein said directing step comprises utilizing at least two different microwave wavelengths.

26. The method of claim 25, further comprising estimating the metal content based on a difference between attenuation of said wavelengths.