DUAL SPECTRUM X-RAY TUBE WITH SWITCHED FOCAL SPOTS AND FILTER

• US 20090161815A1
• Filed: 03/15/2007
• Published: 06/25/2009
• Est. Priority Date: 04/07/2006
• Status: Abandoned Application

• Current Assignee: Koninklijke Philips Electronics N.V. (Koninklijke Philips N.V.)
• Original Assignee: Koninklijke Philips Electronics N.V. (Koninklijke Philips N.V.)
• Inventors: Schäfer, Dirk, Jensen, Dye, Grass, Michael
• Application Number:
  US12/296,110
• Publication Number:
  US 20090161815A1
• Time in Patent Office: Days
• US Class Current: 378/5
• CPC Class Codes: A61B 6/032 Transmission computed tomography [CT]
• CPC Class Codes: A61B 6/4028 resulting in acquisition of views from substantially different positions, e.g. EBCT
• CPC Class Codes: A61B 6/4035 the source being combined with a filter or grating
• CPC Class Codes: A61B 6/4441 the rigid structure being a C-arm or U-arm
• CPC Class Codes: A61B 6/466 adapted to display 3D data
• CPC Class Codes: A61B 6/482 involving multiple energy imaging
• CPC Class Codes: A61B 6/503 for diagnosis of the heart
• CPC Class Codes: A61B 6/504 for diagnosis of blood vessels, e.g. by angiography
• CPC Class Codes: A61B 6/527 using data from a motion artifact sensor
• CPC Class Codes: G01N 2223/419 computed tomograph
• CPC Class Codes: G01N 2223/612 biological material
• CPC Class Codes: G01N 23/046 using tomography, e.g. computed tomography [CT]
• CPC Class Codes: H01J 35/30 by deflection of the cathode ray

Abstract

In three-dimensional computed tomography or three-dimensional rotational X-ray imaging, the acquisition of different spectral measurement data requires subsequent acquisition runs. According to an exemplary embodiment of the present invention, an examination apparatus is provided in which different spectral measurement data are acquired immediately one after another during the same acquisition run by performing a focal spot switching during data acquisition. This may reduce motion artefacts.

Claims

1. Examination apparatus (100) for dual spectrum examination of an object of interest (107), the examination apparatus (100) comprising:

a filter unit (204) adapted for filtering a radiation beam from the object of interest (107), the radiation beam having a focal spot;

a fast focal spot switching unit adapted for switching the focal spot from a first focal spot location to a second focal spot location;

a detector unit (108) adapted for acquiring measurement data on the basis of the radiation beam from the object of interest (107);

wherein the filter unit (204), the first and the second focal spot location are arranged in such a way, that

the radiation beam passes through the filter unit (204) when the focal spot is in the first location, resulting in filtered first spectral measurement data,

and that the radiation beam does not pass through the filter unit (204) when the focal spot is in the second location, resulting in second spectral measurement data.

2. The examination apparatus (100) of claim 1,

wherein the filtered first spectral measurement data and the non-filtered second spectral measurement data are acquired immediately one after another during the same acquisition run.

3. The examination apparatus (100) of claim 1,

wherein the fast focal spot switching unit is adapted as one of a fast electric focal spot switching unit and a magnetic quadrupole switching unit.

4. The examination apparatus (100) of claim 3,

wherein the electric focal spot switching unit is adapted as one of a grid switch and a plate switch.

5. The examination apparatus (100) of claim 1,

wherein the filter unit (204) comprises a copper plate.

6. The examination apparatus (100) of claim 1, the examination apparatus (100) further comprising:

a radiation source adapted as a X-ray tube (104);

wherein the radiation beam is a X-ray beam emitted from the X-ray tube (104).

7. The examination apparatus (100) of claim 1,

wherein the examination apparatus (100) is adapted as one of a 3D computed tomography apparatus and a 3D rotational X-ray apparatus.

8. The examination apparatus (100) of claim 1,

wherein a distance of the first focal spot location and the second focal spot location is in the order of a nominal focal spot value of the radiation beam.

9. The examination apparatus (100) of claim 1,

wherein the first focal spot location and the second focal spot location are located on a line orthogonal to a rotational axis of the radiation source.

10. The examination apparatus (100) of claim 1,

wherein the first focal spot location and the second focal spot location are located on a line having a component parallel to the rotational axis of the radiation source.

11. The examination apparatus (100) of claim 1, configured as one of the group consisting of a material testing apparatus, a medical application apparatus and a micro CT system.

12. An image processing device for examination of an object of interest (107), the image processing device comprising:

a memory for storing a data set of the object of interest (107), the data set comprising filtered first spectral measurement data corresponding to a first focal spot location and non-filtered second spectral measurement data corresponding to a second focal spot location, both data acquired immediately one after another during the same acquisition run;

a reconstruction unit (118) adapted for;

determining a difference between the first spectral measurement data and the second spectral measurement data; and

reconstructing an image of the object of interest (107) on the basis of the difference.

13. The image processing device of claim 12,

wherein the filtered first spectral measurement data and the non-filtered second spectral measurement data are acquired immediately one after another during the same acquisition run by switching the focal spot from the first focal spot location to the second focal spot location;

wherein the radiation beam passes through a filter unit (204) when the focal spot is in the first location, resulting in the filtered first spectral measurement data,

wherein the radiation beam does not pass through the filter unit (204) when the focal spot is in the second location, resulting in the non-filtered second spectral measurement data.

14. A method of examination of an object of interest (107) with an examination apparatus, method comprising the steps of:

detecting filtered first radiation having a focal spot at a first focal spot location, resulting in filtered first spectral measurement data;

switching the focal spot from the first focal spot location the a second focal spot location;

detecting second radiation having a focal spot at the second focal spot location immediately after detection of the filtered first radiation during the same acquisition run, resulting in second spectral measurement data.

15. The method of claim 14, further comprising the steps of:

determining a difference between the first spectral measurement data and the second spectral measurement data; and

reconstructing an image of the object of interest (107) on the basis of the difference.

16. A computer-readable medium (402), in which a computer program of examination of an object of interest is stored which, when being executed by a processor (401), is adapted to carry out the steps of:

detecting filtered first radiation having a focal spot at a first focal spot location, resulting in filtered first spectral measurement data;

switching the focal spot from the first focal spot location the a second focal spot location;

detecting second radiation having a focal spot at the second focal spot location immediately after detection of the filtered first radiation during the same acquisition run, resulting in second spectral measurement data.

17. A program element of examination of an object of interest, which, when being executed by a processor (401), is adapted to carry out the steps of:

detecting filtered first radiation having a focal spot at a first focal spot location, resulting in filtered first spectral measurement data;

switching the focal spot from the first focal spot location the a second focal spot location;

detecting second radiation having a focal spot at the second focal spot location immediately after detection of the filtered first radiation during the same acquisition run, resulting in second spectral measurement data.