Method and Apparatus for Managing Test Result Data Generated by a Semiconductor Test System

• US 20090164931A1
• Filed: 12/19/2007
• Published: 06/25/2009
• Est. Priority Date: 12/19/2007
• Status: Abandoned Application

• Current Assignee: FormFactor Incorporated
• Original Assignee: FormFactor Incorporated
• Inventors: Kemmerling, Todd Ryland
• Application Number:
  US11/960,396
• Publication Number:
  US 20090164931A1
• Time in Patent Office: Days
• US Class Current: 715/771
• CPC Class Codes: G01R 31/2834 Automated test systems [ATE]; using microprocessors or computers G01R31/317 takes precedence; ATE for detection of defective computer hardware G06F11/2736
• CPC Class Codes: G01R 31/2851 Testing of integrated circuits [IC] G01R31/317 takes precedence; testing individual devices G01R31/26; testing printed circuits G01R31/2801

Abstract

Methods, apparatus, and computer readable media for managing test result data generated by a semiconductor test system are described. Examples of the invention can relate to managing test result data generated by a semiconductor test system. In some examples, test result data is obtained from the semiconductor test system responsive to testing of a device under test (DUT). The test result data is processed for storage in a relational database using an interface generated in part based on design information of the DUT.

Claims

1. Apparatus for managing test result data generated by a semiconductor test system configured for testing of a device under test (DUT), comprising:

a computer, coupled to the semiconductor test system, to receive test result data, the computer having an interface generated in part based on design information of the DUT, the interface configured to obtain the test result data and process the test result data for storage in a relational database.

2. The apparatus of claim 1, wherein the interface comprises an application programming interface (API) having a first portion configured to capture the test result data.

3. The apparatus of claim 2, wherein the API includes a second portion configured to process the test result data for storage in the relational database.

4. The apparatus of claim 3, wherein the computer comprises:

a test result parser configured to invoke the first portion of the API to obtain the test result data and the second portion of the API to process the test result data for storage in the relational database.

5. The apparatus of claim 4, wherein the computer comprises:

an API generator configured to generate the first portion of the API in response to at least one of;

the design information of the DUT or test data describing configuration of the testing of the DUT.

6. The apparatus of claim 3, wherein the second portion of the API encapsulates database management language commands.

7. A system, comprising:

a semiconductor tester configured to generate test result data responsive to testing a device under test (DUT); and

a test system controller, coupled to the semiconductor tester, including;

a relational database; and

an interface, generated in part based on design information of the DUT, the interface configured to obtain the test result data from the semiconductor tester and process the test result data for storage in the relational database.

8. The system of claim 7, wherein the interface comprises an application programming interface (API) having a first portion configured to capture the test result data.

9. The system of claim 8, wherein the API includes a second portion configured to process the test result data for storage in the relational database.

10. The system of claim 9, wherein the test system controller comprises:

a test result parser configured to invoke the first portion of the API to obtain the test result data and the second portion of the API to process the test result data for storage in the relational database.

11. The system of claim 10, wherein the test system controller comprises:

an API generator configured to generate the first portion of the API in response to at least one of;

the design information of the DUT or test data describing configuration of the testing of the DUT.

12. A method of managing test result data generated by a semiconductor test system, comprising:

obtaining test result data from the semiconductor test system responsive to testing of a device under test (DUT); and

processing the test result data for storage in a relational database using an interface generated in part based on design information of the DUT.

13. The method of claim 12, further comprising:

accessing the relational database using one or more database management tools to analyze the test result data.

14. The method of claim 12, wherein the interface comprises an application programming interface (API) having a first portion configured to capture the test result data.

15. The method of claim 14, further comprising:

generating the first portion of the API in response to at least one of;

the design information of the DUT or test data describing configuration of the testing of the DUT.

16. The method of claim 14, wherein the API includes a second portion configured to process the test result data for storage in the relational database.

17. The method of claim 16, wherein the second portion of the API encapsulates database management language commands.

18. The method of claim 16, wherein the act of processing comprises:

calling the first portion of the API to capture the test result data; and

calling the second portion of the API to store the test result data in the relational database.

19. A computer readable medium having instructions stored thereon that, when executed by a processor, cause the processor to perform a method of managing test result data generated by a semiconductor test system, comprising:

obtaining test result data from the semiconductor test system responsive to testing of a device under test (DUT); and

processing the test result data for storage in a relational database using an interface generated in part based on design information of the DUT.

20. The computer readable medium of claim 19, wherein the interface comprises an application programming interface (API) having a first portion configured to capture the test result data.

21. The computer readable medium of claim 20, further comprising:

generating the first portion of the API in response to at least one of;

the design information of the DUT or test data describing configuration of the testing of the DUT.

22. The computer readable medium of claim 20, wherein the API includes a second portion configured to process the test result data for storage in the relational database.

23. The computer readable medium of claim 22, wherein the second portion of the API encapsulates database management language commands.

24. The computer readable medium of claim 22, wherein the act of processing comprises:

calling the first portion of the API to capture the test result data; and

calling the second portion of the API to store the test result data in the relational database.

25-44. -44. (canceled)