SYSTEM AND METHODS FOR X-RAY BACKSCATTER REVERSE ENGINEERING OF STRUCTURES

• US 20090168964A1
• Filed: 02/06/2009
• Published: 07/02/2009
• Est. Priority Date: 05/04/2006
• Status: Active Grant

• Current Assignee: The Boeing Co.
• Original Assignee: The Boeing Co.
• Inventors: Georgeson, Gary E., Safai, Morteza, Edwards, William T.
• Granted Patent: US 7,623,626 B2
• Time in Patent Office: Days
• US Class Current: 378/87
• CPC Class Codes: B64F 5/60 Testing or inspecting aircraft components or systems
• CPC Class Codes: G01N 23/203 Measuring back scattering

Abstract

A system and methods for x-ray backscatter reverse engineering of structures. One embodiment includes a plurality of articulated arms attached to a movable base. Another embodiment includes a single counterweighted arm attached to a movable base. The arms include x-ray detectors. At least one x-ray source, which may be mounted on the arm(s), emits x-rays, which are backscattered off the surfaces and objects of interest and captured by the detectors to generate images of hidden objects. The present system provides improved speed and resolution over prior art systems. The system has a field-of-view and effective scanning range versatile enough to work in various orientations and in environments of various sizes. In certain embodiments the system is compact and lightweight so that it can be easily transported and used within confined spaces or in environments where weight is a consideration, such as inside or underneath aircraft. The system is also pointable and adaptable.

Claims

1. A method of interrogating a surface of a structure using an x-ray backscatter system to generate an image of an object obscured behind the surface, the x-ray backscatter system including a mobile base portion, at least a first arm secured to the base at an articulation point, at least one x-ray source, and at least one x-ray detector configured to collect x-rays backscattered from the object, the method comprising:

a) advancing the system through the structure;

b) articulating the arm and the x-ray detector about the articulation point, the x-ray detector being positioned on the arm at a location spaced from the articulation point;

c) linearly extending and contracting the arm with respect to the mobile base portion;

d) generating x-rays from the x-ray source and directing the x-rays toward the surface; and

e) detecting a portion of the x-rays at the x-ray detector after the portion of the x-rays have been backscattered from the object obscured behind the surface.

2. The method of claim 1, wherein steps a) through e) are performed simultaneously.

3. The method of claim 1, wherein articulating the arm and the x-ray detector about the articulation point comprises rotating the arm and the x-ray detector about at least two axes of rotation.

4. The method of claim 1, further comprising articulating a second arm and a second x-ray detector about a second articulation point on the base, the second x-ray detector being positioned on the second arm at a location spaced from the second articulation point.

5. The method of claim 4, wherein the first and second arms articulate independently of one another.

6. The method of claim 1, further comprising capturing images of the surface using a visual camera.

7. A method of interrogating a surface of a structure using an x-ray backscatter system to generate an image of an object obscured behind the surface, the x-ray backscatter system including a mobile base portion, at least a first arm secured to the base at an articulation point, at least one x-ray source, and at least one x-ray detector configured to collect x-rays backscattered from the object, the method comprising:

a) advancing the system through the structure;

b) articulating the arm and the x-ray detector about the articulation point, the x-ray detector being positioned on the arm at a location spaced from the articulation point;

c) articulating a first segment of the arm with respect to a second segment of the arm, the first and second segments being connected by a joint;

d) generating x-rays from the x-ray source and directing the x-rays toward the surface; and

e) detecting a portion of the x-rays at the x-ray detector after the portion of the x-rays have been backscattered from the object obscured behind the surface.

8. The method of claim 7, wherein steps a) through e) are performed simultaneously.

9. The method of claim 7, wherein articulating the arm and the x-ray detector about the articulation point comprises rotating the arm and the x-ray detector about at least two axes of rotation.

10. The method of claim 7, further comprising articulating a second arm and a second x-ray detector about a second articulation point on the base, the second x-ray detector being positioned on the second arm at a location spaced from the second articulation point.

11. The method of claim 10, wherein the first and second arms articulate independently of one another.

12. The method of claim 7, further comprising capturing images of the surface using a visual camera.

13. The method of claim 7, wherein articulating the first segment with respect to the second segment comprises rotating the first segment with respect to the second segment about at least two axes of rotation.

14. A method of interrogating a surface of a structure using an x-ray backscatter system to generate an image of an object obscured behind the surface, the x-ray backscatter system including a mobile base portion, at least a first arm secured to the base at an articulation point, at least one x-ray source, and at least one x-ray detector configured to collect x-rays backscattered from the object, the method comprising:

a) advancing the system through the structure;

b) articulating the arm and the x-ray detector about the articulation point, the x-ray detector being positioned on the arm at a location spaced from the articulation point;

c) generating x-rays from the x-ray source and directing the x-rays toward the surface; and

c) detecting a portion of the x-rays at the x-ray detector after the portion of the x-rays have been backscattered from the object obscured behind the surface;

wherein the arm includes a counterweight at a location spaced from the detector and on an opposite side of the articulation point from the detector.

15. The method of claim 14, wherein steps a) through d) are performed simultaneously.

16. The method of claim 14, wherein articulating the arm and the x-ray detector about the articulation point comprises rotating the arm and the x-ray detector about at least two axes of rotation.

17. The method of claim 14, further comprising articulating a second arm and a second x-ray detector about a second articulation point on the base, the second x-ray detector being positioned on the second arm at a location spaced from the second articulation point.

18. The method of claim 17, wherein the first and second arms articulate independently of one another.

19. The method of claim 14, further comprising capturing images of the surface using a visual camera.

20. A method of interrogating a surface of a structure using an x-ray backscatter system to generate an image of an object obscured behind the surface, the x-ray backscatter system including a mobile base portion, at least a first arm secured to the base at an articulation point, at least one x-ray source, and at least one x-ray detector configured to collect x-rays backscattered from the object, the method comprising:

a) advancing the system through the structure;

b) articulating the arm, the x-ray detector and the x-ray source about the articulation point, the x-ray detector and the x-ray source being positioned on the arm at locations spaced from the articulation point;

c) generating x-rays from the x-ray source and directing the x-rays toward the surface; and

d) detecting a portion of the x-rays at the x-ray detector after the portion of the x-rays have been backscattered from the object obscured behind the surface.

21. The method of claim 20, wherein steps a) through d) are performed simultaneously.

22. The method of claim 20, wherein articulating the arm and the x-ray detector about the articulation point comprises rotating the arm and the x-ray detector about at least two axes of rotation.

23. The method of claim 20, further comprising articulating a second arm and a second x-ray detector about a second articulation point on the base, the second x-ray detector being positioned on the second arm at a location spaced from the second articulation point.

24. The method of claim 23, wherein the first and second arms articulate independently of one another.

25. The method of claim 20, further comprising capturing images of the surface using a visual camera.