DYNAMIC REDUNDANCY FOR MICROPROCESSOR COMPONENTS AND CIRCUITS PLACED IN NONOPERATIONAL MODES
First Claim
1. A method for implementing dynamic redundancy for a microprocessor system, the method comprising:
- selectively placing at least one of a plurality of microprocessor components in a non-operational mode while one or more other of the microprocessor components remain in an operational mode, and then subsequently restoring the at least one of a plurality of microprocessor components from the non-operational mode back to the operational mode, wherein the operational mode comprises the performance of one or more tasks for which the microprocessor component is designed to execute with respect to the microprocessor system;
switching a spare microprocessor component from the non-operational mode to the operational mode whenever one of the plurality of the microprocessor components is placed in the non-operational mode, and wherein the spare microprocessor component is configured to be switched back to the non-operational mode whenever each of the microprocessor components are in the operational mode; and
mapping, through multiplexing circuitry, the use of the microprocessor components and the spare microprocessor component with respect to the operational mode and the non-operational mode;
wherein the non-operational mode comprises a process designed to reverse aging mechanisms of transistor devices included in the plurality of microprocessor components, the aging mechanisms including one or more of;
negative bias temperature instability (NBTI), positive bias temperature instability (PBTI), and time dependent dielectric breakdown (TDDB).
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Abstract
An apparatus for implementing dynamic redundancy for a microprocessor system includes a plurality of microprocessor components, each of which is capable of being selectively placed in a non-operational mode while one or more other of the microprocessor components remain in an operational mode, and then subsequently restored from the non-operational mode back to the operational mode, the spare microprocessor component configured to be switched from the non-operational mode to the operational mode whenever one of the plurality of the microprocessor components is placed in the non-operational mode, and wherein the spare microprocessor component is configured to be switched back to the non-operational mode whenever each of the microprocessor components are in the operational mode; and multiplexing circuitry configured to map the use of the microprocessor components and the spare microprocessor component with respect to the operational mode and the non-operational mode.
12 Citations
5 Claims
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1. A method for implementing dynamic redundancy for a microprocessor system, the method comprising:
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selectively placing at least one of a plurality of microprocessor components in a non-operational mode while one or more other of the microprocessor components remain in an operational mode, and then subsequently restoring the at least one of a plurality of microprocessor components from the non-operational mode back to the operational mode, wherein the operational mode comprises the performance of one or more tasks for which the microprocessor component is designed to execute with respect to the microprocessor system; switching a spare microprocessor component from the non-operational mode to the operational mode whenever one of the plurality of the microprocessor components is placed in the non-operational mode, and wherein the spare microprocessor component is configured to be switched back to the non-operational mode whenever each of the microprocessor components are in the operational mode; and mapping, through multiplexing circuitry, the use of the microprocessor components and the spare microprocessor component with respect to the operational mode and the non-operational mode; wherein the non-operational mode comprises a process designed to reverse aging mechanisms of transistor devices included in the plurality of microprocessor components, the aging mechanisms including one or more of;
negative bias temperature instability (NBTI), positive bias temperature instability (PBTI), and time dependent dielectric breakdown (TDDB). - View Dependent Claims (2, 3, 4, 5)
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Specification