Self-refresh period measurement circuit of semiconductor device
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Abstract
A self-refresh period measurement circuit of a semiconductor device is disclosed, herein which includes a period measurement start signal generator configured to receive a self-refresh signal and an oscillation signal, to allow a self-refresh operation to be performed, and generate a period measurement start signal, to set the time that the oscillation signal is enabled, and a refresh period output unit configured to receive the period measurement start signal and the oscillation signal, and generate a refresh period output signal that is enabled for a period from the time that the period measurement start signal is enabled to a time that the oscillation signal is enabled.
9 Citations
42 Claims
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1-33. -33. (canceled)
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34. A self-refresh period measurement circuit of a semiconductor device comprising:
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a period measurement start signal generator for configured to receive a self-refresh signal and an oscillation signal that is periodically enabled by a first width after the self-refresh signal is enabled, to allow a self-refresh operation to be performed, and generate a period measurement start signal that is enabled by a second width at a time that the oscillation signal is enabled for the first time, to set the time that the oscillation signal is enabled for the first time as a start time for measurement of a self-refresh period; and a refresh period output unit configured to receive the period measurement start signal and the oscillation signal, and generate a refresh period output signal that is enabled for a period from the time that the period measurement start signal is enabled to a time that the oscillation signal is enabled for the second time. - View Dependent Claims (35, 36, 37, 38, 39, 40, 41, 42)
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Specification