Common test logic for multiple operation modes
First Claim
1. An apparatus comprising:
- a processor having a plurality of logical units to perform operations on data, wherein each of the logical units includes a multiple input shift register (MISR) at an input of the logical unit to collect and compress data from a plurality of input signals to the logical unit, wherein the MISR is a common test structure to perform design for test (DFT) operations, reliability-availability-serviceability (RAS) operations, structured based functional test (SBFT) operations and debug operations, wherein the plurality of MISRs are configured as a scan chain having a first MISR coupled to an output of a test access port (TAP) controller and a last MISR coupled to an input of the TAP controller.
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Abstract
In one embodiment, the present invention includes a processor having a plurality of logical units to perform operations on data. Each unit may include a multiple input shift register (MISR) at an input of the logical unit to collect and compress data from input signals to the unit. In turn, each MISR may includes bit cells, each having a first cell to receive incoming data and controlled by a first clock signal, a second cell to receive an output of the first cell and controlled by a second clock signal, a mask cell to receive an output of the second cell and to generate a mask signal responsive to a mask clock signal, and a multiplexer coupled between the first and second cells. Other embodiments are described and claimed.
17 Citations
15 Claims
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1. An apparatus comprising:
a processor having a plurality of logical units to perform operations on data, wherein each of the logical units includes a multiple input shift register (MISR) at an input of the logical unit to collect and compress data from a plurality of input signals to the logical unit, wherein the MISR is a common test structure to perform design for test (DFT) operations, reliability-availability-serviceability (RAS) operations, structured based functional test (SBFT) operations and debug operations, wherein the plurality of MISRs are configured as a scan chain having a first MISR coupled to an output of a test access port (TAP) controller and a last MISR coupled to an input of the TAP controller. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10)
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11. A system comprising:
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a processor having a plurality of logical units to perform operations on data, where each of the logical units includes a multiple input shift register (MISR) at an input of the logical unit to collect and compress data from a plurality of input signals to the logical unit, each MISR including a plurality of bit cells, each bit cell having a first cell to receive incoming data and controlled by a first clock signal, a second cell to receive an output of the first cell and controlled by a second clock signal, a mask cell to receive an output of the second cell and to generate a mask signal responsive to a mask clock signal, and a multiplexer coupled between the first cell and the second cell to provide the output of the first cell in a first mode and to provide a data bit from a different logical unit in a second mode; and a dynamic random access memory (DRAM) coupled to the processor. - View Dependent Claims (12, 13, 14, 15)
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Specification