SYSTEMS AND METHODS FOR TEST TIME OUTLIER DETECTION AND CORRECTION IN INTEGRATED CIRCUIT TESTING
First Claim
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1. A system for semiconductor testing, comprising:
- an algorithm engine, external to a tester, configured to recognize that a device is testing too slowly and that a test program should be aborted;
said algorithm engine configured to indicate to a tester to abort said test program on said semiconductor device.
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Abstract
Methods and systems for semiconductor testing are disclosed. In one embodiment, devices which are testing too slowly are prevented from completing testing, thereby allowing untested devices to begin testing sooner.
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15 Claims
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1. A system for semiconductor testing, comprising:
an algorithm engine, external to a tester, configured to recognize that a device is testing too slowly and that a test program should be aborted;
said algorithm engine configured to indicate to a tester to abort said test program on said semiconductor device.- View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15)
Specification