Component for semicondutor processing apparatus and manufacturing method thereof
First Claim
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1. A component for a semiconductor processing apparatus, the component comprising:
- a matrix defining a shape of the component; and
a protection film covering a predetermined surface of the matrix,wherein the protection film consists essentially of an amorphous oxide of a first element selected from the group consisting of aluminum, silicon, hafnium, zirconium, and yttrium, and has a porosity of less than 1% and a thickness of 1 nm to 10 μ
m.
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Abstract
A component (10) for a semiconductor processing apparatus includes a matrix (10a) defining a shape of the component, and a protection film (10c) covering a predetermined surface of the matrix. The protection film (10c) consists essentially of an amorphous oxide of a first element selected from the group consisting of aluminum, silicon, hafnium, zirconium, and yttrium. The protection film (10c) has a porosity of less than 1% and a thickness of 1 nm to 10 μm.
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20 Claims
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1. A component for a semiconductor processing apparatus, the component comprising:
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a matrix defining a shape of the component; and a protection film covering a predetermined surface of the matrix, wherein the protection film consists essentially of an amorphous oxide of a first element selected from the group consisting of aluminum, silicon, hafnium, zirconium, and yttrium, and has a porosity of less than 1% and a thickness of 1 nm to 10 μ
m. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11)
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12. A method for manufacturing a component used for a semiconductor processing apparatus, the method comprising:
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preparing a matrix defining a shape of the component; and forming a protection film covering a predetermined surface of the matrix, wherein said forming a protection film comprises alternately supplying a first source gas containing a first element and a second source gas containing an oxidation gas, thereby laminating layers formed by CVD (Chemical Vapor Deposition) and having a thickness of an atomic or molecular level, and wherein the first element is selected from the group consisting of aluminum, silicon, hafnium, zirconium, and yttrium. - View Dependent Claims (13, 14, 15, 16, 17, 18)
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19. A semiconductor processing apparatus comprising:
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a process container having a process field configured to accommodate a target substrate; a support member configured to support the target substrate within the process field; an exhaust system configured to exhaust the process field; and a gas supply system configured to supply a process gas into the process field, wherein a component forming a part of one of the process field, the exhaust system, and the gas supply system comprises a matrix defining a shape of the component, and a protection film covering a predetermined surface of the matrix, and wherein the protection film consists essentially of an amorphous oxide of an element selected from the group consisting of aluminum, silicon, hafnium, zirconium, and yttrium, and has a porosity of less than 1% and a thickness of 1 nm to 10 μ
m. - View Dependent Claims (20)
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Specification